參數(shù)資料
型號: MTB10N40ET4
廠商: ON SEMICONDUCTOR
元件分類: JFETs
英文描述: 10 A, 400 V, 0.55 ohm, N-CHANNEL, Si, POWER, MOSFET
封裝: CASE 418B-02, D2PAK-3
文件頁數(shù): 8/11頁
文件大?。?/td> 276K
代理商: MTB10N40ET4
MTB10N40E
http://onsemi.com
6
td(of
10000
1000
100
10
t,TIME
(ns)
RG, GATE RESISTANCE (OHMS)
10
100
10
1
DRAINTOSOURCE DIODE CHARACTERISTICS
Figure 8. GateToSource and DrainToSource
Voltage versus Total Charge
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
Figure 10. Diode Forward Voltage versus Current
V
GS
,GA
TET
OSOURCE
VOL
TAGE
(VOL
TS)
0
8
4
0
Qg, TOTAL CHARGE (nC)
16
12
20
40
80
60
VDD = 200 V
ID ≈ 10 A
VGS = 10 V
TJ = 25°C
VSD, SOURCETODRAIN VOLTAGE (VOLTS)
I S
,SOURCE
CURRENT
(AMPS)
10
9
8
7
6
3
2
0
1
4
5
1.2
1
0.8
0.6
0.4
0.2
tf
tr
td(on
VGS = 0 V
TJ = 25°C
ID = 10 A
VDS = 100 V
250 V
320 V
20
40
200
400
2000
4000
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define
the maximum simultaneous draintosource voltage and
drain current that a transistor can handle safely when it is
forward biased. Curves are based upon maximum peak
junction temperature and a case temperature (TC) of 25°C.
Peak repetitive pulsed power limits are determined by using
the thermal response data in conjunction with the
procedures discussed in AN569, “Transient Thermal
ResistanceGeneral Data and Its Use.”
Switching between the offstate and the onstate may
traverse any load line provided neither rated peak current
(IDM) nor rated voltage (VDSS) is exceeded and the
transition time (tr,tf) do not exceed 10 μs. In addition the
total power averaged over a complete switching cycle must
not exceed (TJ(MAX) TC)/(RθJC).
A Power MOSFET designated EFET can be safely used
in switching circuits with unclamped inductive loads. For
reliable operation, the stored energy from circuit inductance
dissipated in the transistor while in avalanche must be less
than the rated limit and adjusted for operating conditions
differing from those specified. Although industry practice is
to rate in terms of energy, avalanche energy capability is not
a constant. The energy rating decreases nonlinearly with
an increase of peak current in avalanche and peak junction
temperature.
Although many EFETs can withstand the stress of
draintosource avalanche at currents up to rated pulsed
current (IDM), the energy rating is specified at rated
continuous current (ID), in accordance with industry custom.
The energy rating must be derated for temperature as
shown in the accompanying graph (Figure 12). Maximum
energy at currents below rated continuous ID can safely be
assumed to equal the values indicated.
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