參數(shù)資料
型號： MM908E425AIDWB
廠商： 飛思卡爾半導(dǎo)體(中國)有限公司
英文描述： Integrated Quad Half H-Bridge with Power Supply, Embedded MCU, and LIN Serial Communication
中文描述： 綜合四半僅符合電源橋，嵌入式微控制器和LIN串行通信
文件頁數(shù)： 6/49頁
文件大小： 490K
代理商： MM908E425AIDWB
Analog Integrated Circuit Device Data
Freescale Semiconductor
6
908E425
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 3. Static Electrical Characteristics
All characteristics are for the analog chip only. Refer to the 68HC908EY16 specification for characteristics of the
microcontroller chip. Characteristics noted under conditions 9.0 V
≤
V
SUP
≤
16 V, 0
°
C
≤
T
J
≤
125
°
C unless otherwise noted.
Typical values noted reflect the approximate parameter mean at T
A
= 25
°
C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
SUPPLY VOLTAGE
Nominal Operating Voltage
V
SUP
8.0
–
18
V
SUPPLY CURRENT
NORMAL Mode
V
SUP
= 12 V, Power Die ON (PSON = 1), MCU Operating Using
Internal Oscillator at 32 MHz (8.0 MHz Bus Frequency), SPI, ESCI,
ADC Enabled
STOP Mode
(6)
V
SUP
= 12 V, Cyclic Wake-Up Disabled
I
RUN
I
STOP
–
–
20
–
–
60
mA
μ
A
DIGITAL INTERFACE RATINGS (ANALOG DIE)
Output Pins
RST_A
,
IRQ_A
Low-State Output Voltage (I
OUT
= - 1.5 mA)
High-State Output Voltage (I
OUT
= 1.0
μ
A)
V
OL
V
OH
–
3.85
–
–
0.4
–
V
Output Pins BEMF, RXD
Low-State Output Voltage (I
OUT
= - 1.5 mA)
High-State Output Voltage (I
OUT
= 1.5 mA)
V
OL
V
OH
–
3.85
–
–
0.4
–
V
Output Pin RXD – Capacitance
(7)
C
IN
–
4.0
–
pF
Input Pins
RST_A
, FGEN,
SS
Input Logic Low Voltage
Input Logic High Voltage
V
IL
V
IH
–
3.5
–
–
1.5
–
V
Input Pins
RST_A
, FGEN,
SS
– Capacitance
(7)
C
IN
–
4.0
–
pF
Pins
RST_A
,
IRQ_A
– Pullup Resistor
R
PULLUP
1
–
10
–
k
Pin
SS
– Pullup Resistor
R
PULLUP
2
–
60
–
k
Pins FGEN, MOSI, SPSCK – Pulldown Resistor
R
PULLDOWN
–
60
–
k
Pin TXD – Pullup Current Source
I
PULLUP
–
35
–
μ
A
Notes
6.
7.
STOP mode current will increase if V
SUP
exceeds 15 V.
This parameter is guaranteed by process monitoring but is not production tested.
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