參數(shù)資料
型號: MCIMX27VOP4
廠商: FREESCALE SEMICONDUCTOR INC
元件分類: 微控制器/微處理器
英文描述: 32-BIT, 400 MHz, MICROPROCESSOR, PBGA404
封裝: 17 X 17 MM, 0.65 MM PITCH, LEAD FEE, MAPBGA-404
文件頁數(shù): 43/118頁
文件大?。?/td> 1159K
代理商: MCIMX27VOP4
i.MX27 Data Sheet, Advance Information, Rev. 0.1
30
Preliminary—Subject to Change Without Notice
Freescale Semiconductor
Signal Descriptions
CLKMODE[1:0]
These are special factory test signals. To ensure proper operation, do not connect to these
signals.
EXTAL32K
32 kHz crystal input (Note: in the RTC power domain)
XTAL32K
Oscillator output to 32 kHz crystal (Note: in the RTC power domain)
Power_cut
(Note: in the RTC power domain)
Power_on_reset
(Note: in the RTC power domain)
osc32K_bypass
The signal for osc32k input bypass (Note: in the RTC power domain)
Bootstrap
BOOT [3:0]
System Boot Mode Select—The operational system boot mode of the i.MX27 processor upon
system reset is determined by the settings of these pins. BOOT[1:0] are also used as
handshake signals to PMIC(VSTBY).
JTAG
JTAG_CTRL
JTAG Controller select signal—JTAG_CTRL is sampled during rising edge of TRST. Must be
pulled to logic high for proper JTAG interface to debugger. Pulling JTAG_CRTL low is for internal
test purposes only.
TRST
Test Reset Pin—External active low signal used to asynchronously initialize the JTAG controller.
TDO
Serial Output for test instructions and data. Changes on the falling edge of TCK.
TDI
Serial Input for test instructions and data. Sampled on the rising edge of TCK.
TCK
Test Clock to synchronize test logic and control register access through the JTAG port.
TMS
Test Mode Select to sequence JTAG test controller’s state machine. Sampled on rising edge of
TCK.
RTCK
JTAG Return Clock used to enhance stability of JTAG debug interface devices. This signal is
multiplexed with 1-Wire; thus, utilizing 1-Wire will render RTCK unusable and vice versa; PE16.
Secure Digital Interface (X2)
SD1_CMD
SD Command bidirectional signal—If the system designer does not want to make use of the
internal pull-up, via the Pull-up enable register, a 4. 7K–69 K external pull up resistor must be
added. This signal is multiplexed with CSPI3_MOSI; PE22.
SD1_CLK
SD Output Clock. This signal is multiplexed with CSPI3_SCLK; PE23.
SD1_D[3:0]
SD Data bidirectional signals—If the system designer does not want to make use of the internal
pull-up, via the Pull-up enable register, a 50 K–69 K external pull up resistor must be added.
SD1_D[3] is muxed with CSPI3_SS while SD1_D[0] is muxed with CSPI3_MISO PE21–18.
SD2_CMD
SD Command bidirectional signal. This signal is multiplexed with MSHC_BS; through GPIO
multiplexed with SLCDC1_CS; PB8.
SD2_CLK
SD Output Clock signal. This signal is multiplexed with MSHC_SCLK, through GPIO
multiplexed with SLCDC1_CLK; PB9.
SD2_D[3:0]
SD Data bidirectional signals. SD2_D[3:0] multiplexed with MSHC_DATA[0:3], also through
GPIO SD2_1:0] multiplexed with SLCDC1_RS and SLDCD1_D0; PB7–PB4.
Table 3. i.MX27 Signal Descriptions (continued)
Pad Name
Function/Notes
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