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參數(shù)資料
| 型號： | MC12429FA |
| 廠商： | FREESCALE SEMICONDUCTOR INC |
| 元件分類： | 時鐘產(chǎn)生/分配 |
| 英文描述： | 400 MHz, OTHER CLOCK GENERATOR, PQFP32 |
| 封裝： | LQFP-32 |
| 文件頁數(shù)： | 6/9頁 |
| 文件大?。?/td> | 173K |
| 代理商： | MC12429FA |
MC12429
FREESCALE SEMICONDUCTOR ADVANCED CLOCK DRIVERS DEVICE DATA
357
Figure 5. Serial Test Clock Block Diagram (PLL bypass)
Table 3. DC Characteristics (VCC = 3.3V ±5%)
Symbol
Characteristic
0
°C
25
°C
70
°C
Condition
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
VIH
Input HIGH Voltage
2.2
V
VIL
Input LOW Voltage
0.8
V
IIN
Input Current
1.0
mA
VOH
Output HIGH Voltage
TEST
2.5
V
IOH = –0.8mA
VOL
Output LOW Voltage
TEST
0.4
V
IOL = 0.8mA
VOH
Output HIGH Voltage1
FOUT, FOUT
1.
50
to V
CC – 2.0V termination.
2.28
2.60
2.32
2.49
2.38
2.565
V
VCCO = 3.3V
2
2.
Output levels will vary 1:1 with VCC0 variation.
VOL
Output LOW Voltage1
FOUT, FOUT
1.35
1.67
1.35
1.67
1.35
1.70
V
VCCO = 3.3V
2
ICC
Power Supply Current
VCC
PLL_VCC
85
15
100
20
85
15
100
20
85
15
100
20
mA
Table 4. DC Characteristics (VCC = 5.0V ±5%)
Symbol
Characteristic
0
°C
25
°C
70
°C
Condition
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
VIH
Input HIGH Voltage
3.5
V
VIL
Input L
OW Voltage
0.8
V
IIN
Input Current
1.0
mA
VOH
Output HIGH Voltage
TEST
2.5
V
IOH = –0.8mA
VOL
Output LOW Voltage
TEST
0.4
V
IOL = 0.8mA
VOH
Output HIGH Voltage1
FOUT, FOUT
1.
50
to V
CC – 2.0V termination.
3.98
4.30
4.02
4.19
4.08
4.265
V
VCCO = 5.0V
2
2.
Output levels will vary 1:1 with VCC0 variation.
VOL
Output LOW Voltage1
FOUT, FOUT
3.05
3.37
3.05
3.37
3.05
3.40
V
VCCO = 5.0V
2
ICC
Power Supply Current
VCC
PLL_VCC
85
15
100
20
85
15
100
20
85
15
100
20
mA
FDIV4
MCNT
LOW
FOUT
MCNT
FREF
HIGH
TEST
MUX
7
0
TEST
FOUT
(VIA ENABLE GATE)
N DIVIDE
(2, 4, 8, 16)
0
1
PLL 12429
LATCH
Reset
PLOADB
M COUNTER
SLOAD
T0
T1
T2
VCO
SHIFT
REG
14-BIT
DECODE
SDATA
SCLOCK
MCNT
FREF
SEL_CLK
T2=T1=1, T0=0: Test Mode (PLL bypass)
SCLOCK is selected, MCNT is on TEST output, SCLOCK DIVIDE BY N is on FOUT pin
PLOADB acts as reset for test pin latch. When latch reset T2 data is shifted out TEST pin.
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