參數(shù)資料
型號(hào): MAX5556ESA+T
廠商: Maxim Integrated Products
文件頁數(shù): 12/17頁
文件大?。?/td> 0K
描述: IC DAC STEREO AUDIO 8-SOIC
產(chǎn)品培訓(xùn)模塊: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
標(biāo)準(zhǔn)包裝: 2,500
位數(shù): 16
數(shù)據(jù)接口: I²S,串行
轉(zhuǎn)換器數(shù)目: 2
電壓電源: 單電源
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 8-SOIC(0.154",3.90mm 寬)
供應(yīng)商設(shè)備封裝: 8-SOIC
包裝: 帶卷 (TR)
輸出數(shù)目和類型: 2 電壓,單極
采樣率(每秒): 50k
MAX5556
Low-Cost Stereo Audio DAC
4
Maxim Integrated
ELECTRICAL CHARACTERISTICS (continued)
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
INTERNAL SCLK MODE
LRCLK Duty Cycle
(Note 7)
50
%
Internal SCLK Period
tISCLK
(Note 8)
1/fSCLK
ns
LRCLK Edge to Internal SCLK
tISCLKR
tISCLK/2
ns
tISDS
tMCLK + 10
SDATA Valid to Internal SCLK
Rising Setup Time
tISDH
MCLK period = tMCLK
tMCLK
ns
(VDD = +4.75V to +5.5V, VGND = 0V, ROUT_ = 10kΩ, COUT_ = 10pF, 0dBFS sine-wave signal at 997Hz, fLRCLK (fS) = 48kHz, fMCLK
= 12.288MHz, measurement bandwidth 10Hz to 20kHz, TA = -40°C to +85°C, outputs are unloaded, unless otherwise noted. Typical
values at VDD = +5V, TA = +25°C.) (Note 1)
Note 1: 100% production tested at TA = +85°C. Limits to -40°C are guaranteed by design.
Note 2: 0.5 LSB of triangular PDF dither added to data.
Note 3: Guaranteed by design, not production tested.
Note 4: PSRR test block diagram shown in Figure 1 denotes the test setup used to measure PSRR.
Note 5: Volume ramping interval starts from establishment of a valid MCLK to LRCLK ratio. Total time is proportional to the sample
rate (fS). 20ms based on 48ksps operation.
Note 6: In external SCLK mode, LRCLK duty cycles are not limited, provided all data formatting requirements are met. See Figure 4.
Note 7: The LRCLK duty cycle must be 50% ±1/2 MCLK period in internal SCLK mode.
Note 8: The SCLK/LRCLK ratio can be set to 32, 48, or 64, depending on the MCLK/LRCLK ratio selected. See Figure 4.
MCLK
SDATA
LRCLK
SCLK
ACTIVE
CLOCKS
GND
VDD
SPECTRUM
ANALYZER
LOUT, ROUT
ZG
AUDIO SIGNAL
GENERATOR
(100mVP-P AT 1kHz)
DC POWER SUPPLY
(5VDC)
MAX5556
+
-
Figure 1. PSRR Test Block Diagram
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