參數(shù)資料
型號: LH51BV1000J
廠商: Sharp Corporation
英文描述: CMOS 1M (128K x8) Static Ram(CMOS 1M (128K x8) 靜態(tài)Ram)
中文描述: 100萬的CMOS(128K的× 8)靜態(tài)隨機存儲器(100萬的CMOS(128K的× 8)靜態(tài)羊)
文件頁數(shù): 7/11頁
文件大小: 77K
代理商: LH51BV1000J
D
IN
51BV1000-4
ADDRESS
OE
t
WC
t
WR
t
CW
t
CW
t
WR
t
AS
t
WP
t
OHZ
t
DW
t
WR
t
DH
DATA VALID
CE
1
CE
2
WE
D
OUT
1. A write occurs during the overlap of a LOW CE
1
, a HIGH CE
2
and a LOW WE,
A write begins at the latest transition among CE
1
going LOW, CE
2
going HIGH
and WE going LOW. A write ends at the earliest transition among CE
1
going
HIGH, CE
2
going LOW and WE going HIGH. t
WP
is measured from the beginning
of write to the end of write.
2. t
CW
is measured from the latter of CE
1
going LOW or CE
2
going HIGH to the
end of write.
3. t
AS
is measured from the address valid to the beginning of write.
4. t
WR
is measured from the end of write to the address change. t
WR1
applies
in case a write ends at CE
1
or WE going HIGH. t
WR2
applies in case a write
ends at CE
2
going LOW.
5. During this period, I/O pins are in the output state, therefore the input signals
of opposite phase to the outputs must not be applied.
6. If CE
1
goes LOW simultaneously with WE going LOW or after WE going LOW,
the outputs remain in high impedance state.
7. If CE
1
goes HIGH simulaneously with WE going HIGH or before WE going HIGH,
the outputs remain in high impedance state.
NOTES:
(NOTE 4)
(NOTE 2)
(NOTE 2)
(NOTE 1)
(NOTE 3)
(NOTE 6)
(NOTE 5)
t
AW
Figure 4. Write Cycle (OE Controlled)
CMOS 1M (128K
×
8) Static RAM
LH51BV1000J
7
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