參數(shù)資料
型號(hào): K6R3024V1D
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 128K x 24 Bit High-Speed CMOS Static RAM(3.3V Operating)
中文描述: 128K的× 24位高速CMOS靜態(tài)RAM(3.3V的工作)
文件頁(yè)數(shù): 4/9頁(yè)
文件大?。?/td> 172K
代理商: K6R3024V1D
K6R3024V1D
CMOS SRAM
Revision 1.0
December 2001
- 4 -
for AT&T
AC TEST CONDITIONS*
(T
A
=0 to 70
°
C, Vcc=3.3
±
0.3V, unless otherwise specified)
* The above parameters are also guaranteed at industrial temperature range.
Parameter
Value
Input Pulse Levels
0V to 3.0V
Input Rise and Fall Times
3ns
Input and output Timing Reference Levels
1.5V
Output Load
See Below
CAPACITANCE*
(T
A
=25
°
C, f=1.0MHz)
* Capacitance is sampled and not 100% tested
Item
Symbol
Test Conditions
MIN
Max
Unit
Input/Output Capacitance
C
I/O
V
I/O
=0V
-
8
pF
Input Capacitance
C
IN
V
IN
=0V
-
15
pF
Output Loads(B)
for t
HZ
, t
LZ
, t
WHZ
, t
OW
, t
OLZ
& t
OHZ
D
OUT
5pF*
319
216
+3.3V
* Including Scope and Jig Capacitance
Output Loads(A)
D
OUT
R
L
= 50
Z
O
= 50
V
L
= 1.5V
30pF*
* Capacitive Load consists of all components of the
test environment.
DC AND OPERATING CHARACTERISTICS*
(T
A
=0 to 70
°
C, Vcc=3.3
±
0.3V, unless otherwise specified)
* The above parameters are also guaranteed at industrial temperature range.
* CS represents CS
1
, CS
2
and CS
3
in this data sheet. CS
2
as of opposite polarity to CS
1
and CS
3.
Parameter
Symbol
Test Conditions
Min
Max
Unit
Input Leakage Current
I
LI
V
IN
=V
ss
to V
CC
-
6
μ
A
Output Leakage Current
I
LO
CS=V
IH
or OE=V
IH
or WE=V
IL
V
OUT
=V
SS
to
V
CC
-
2
μ
A
Operating Current
I
CC
Min. Cycle, 100% Duty
CS=V
IL,
V
IN
=V
IH
or
V
IL,
I
OUT
=0mA
-09
-
170
mA
-10
-
150
mA
-12
-
130
mA
Standby Current
I
SB
Min. Cycle, CS=V
IH
-09
-
40
mA
-10
-
40
mA
-12
-
40
mA
I
SB1
f=0MHz, CS
V
CC
-0.2V,
V
IN
V
CC
-0.2V or V
IN
0.2V
-09
-
15
mA
-10
-
15
mA
-12
-
15
mA
Output Low Voltage Level
V
OL
I
OL
=8mA
-
0.4
V
Output High Voltage Level
V
OH
I
OH
=-4mA
2.4
-
V
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