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參數(shù)資料
| 型號： | HD74AC |
| 廠商： | Hitachi,Ltd. |
| 英文描述： | HD74AC Series Common Information |
| 中文描述： | HD74AC系列通用信息 |
| 文件頁數(shù)： | 48/52頁 |
| 文件大?。?/td> | 220K |
| 代理商： | HD74AC |
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Design Considerations
47
1.000
0.000
0.000
5.000
0.5000V/dlc
V
IN
I
C
0
Figure 21 I
CC
versus Input Voltage for HD74ACT Devices
The Delta I
CC
specification is the increase in I
CC
. For each input at V
CC
-2.1 V, the Delta I
CC
value should be
added to the quiescent supply current to arrive at the circuit’s worst-case static I
CC
value.
Fortunately, there are several factors which tend to reduce the increase in I
CC
per input. Most TTL devices
will be able to drive FACT inputs well beyond the TTL output specification due to FACT’s low input
loading in a typical system. For example, FAST logic outputs can drive HD74ACT-type inputs down to
200 mV and up to 3.5 V. Additionally, the typical I
CC
increase per input will be less than the specified
limit. As shown in the graph above, the I
CC
increase at V
CC
-2.1 V is less than 200
μ
A in the typical system.
Experiments have shown that the I
CC
of an HD74ACT240 series device typically increases only 200
μ
A
when all of the inputs are connected to a FAST device instead of ground or V
CC
.
It is important when designing with FACT, as with any TTL-compatible CMOS technology, that the Delta
I
CC
specification be considered. Designers should be aware of the spec’s significance and that the data
book specification is a worst-case value; most systems will see values that are much less.
7. Testing Advanced CMOS Devices with I/O Pins
There are more and more CMOS families becoming available which can replace TTL circuits. Although
testing these new CMOS units with programs and fixtures which were developed for bipolar devices will
yield acceptable results most of the time, there are some cases where this approach will cause the test
engineer problems.
Such is the case with parts that have a bidirectional pin, exemplified by the HD74AC245/HD74ACT245
octal transceiver. If the proper testing methods are not followed, these types of parts may not pass those
tests for I
CC
and input leakage currents, even when there is no fault with the devices.
CMOS circuits, unlike their bipolar counterparts, have static I
CC
specification orders of magnitude less than
standard load currents. Most CMOS I
CC
specifications are usually less than 100
μ
A. When conducting an
I
CC
test, greater care must be taken so that other currents will not mask the actual I
CC
so that other currents
will not mask the actual I
CC
of the device. These currents are usually sourced from the inputs and outputs.
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