參數(shù)資料
型號(hào): FBMH4532HM202NT
廠商: TAIYO YUDEN CO LTD
元件分類: 數(shù)據(jù)傳輸濾波器
英文描述: 1 FUNCTIONS, 1.5 A, FERRITE CHIP
文件頁數(shù): 63/67頁
文件大小: 5322K
代理商: FBMH4532HM202NT
355
FERRITE
PRODUCTS
5
RELIABILITY DATA
9/9
Item
LA02 Type/
LA03 Type
Specified Value
Test Method and Remarks
27.Low temperature life test
28.High temperature life test
LA
D
Temperature
DK25M2C
Duration
D1000 hrs
Recovery
DAt least 1hr of recovery under the standard re-
moval from test chamber, followed by the mea-
surement within 2hrs.
LHL
D
Temperature
DK40M3C
Duration
D1000M24 hrs
Recovery
D1 to 2hrs of recovery under the standard con-
dition after the removal from the test cfamber.
LAV35
D
Temperature
DK40M3C
Duration
D1000 hrs
Recovery
DAt least 1hr of recovery under the standard re-
moval from test chamber, followed by the mea-
surement within 2hrs.
FL
D
Temperature
DK40M3C
Duration
D500fJ12, K0ghrs
Recovery
D1 to 2hrs of recovery under the standard con-
dition after the removal from the test cfamber.
LHL
D
Temperature
D105M3C
Duration
D1000M24 hrs
Recovery
D1 to 2hrs of recovery under the standard con-
dition after the removal from the test cfamber.
FL
D
Temperature
D85M3C
Duration
D500fJ12, K0ghrs
Recovery
D1 to 2hrs of recovery under the standard con-
dition after the removal from the test cfamber.
LA05 Type
LHL
FBA/FBR
LAV35
LA04 Type
L/L
D
WithinM10L
Q
D30min.
Appearance
D
No abnor-
mality
Inductance
change
D
WithinM10L
Q change
D
WithinM30L
f
LHLP
D
only
L/Lg
Appearance
D
No abnor-
mality
Inductance
change
D
WithinM10L
Q change
D
WithinM30L
FL05
Type
FL06BT
Type
L/L
D
WithinM10L
Q
D20min.
Refer to
individual
specifica-
tion
Refer to
individual
specifica-
tion
L/L
D
WithinM10L
Q/Q
D
WithinM30L
L/L
D
WithinM10L
Q
D15min.
Appearance
D
No abnor-
mality
Impedance
change
D
WithinM20L
Appearance
D
No abnor-
mality
Impedance
change
D
WithinM20L
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