參數(shù)資料
型號(hào): EP20K200FC484-3V
廠商: Altera
文件頁(yè)數(shù): 69/117頁(yè)
文件大小: 0K
描述: IC APEX 20KE FPGA 200K 484-BGA
標(biāo)準(zhǔn)包裝: 60
系列: APEX-20K®
LAB/CLB數(shù): 832
邏輯元件/單元數(shù): 8320
RAM 位總計(jì): 106496
輸入/輸出數(shù): 382
門數(shù): 404000
電源電壓: 2.375 V ~ 2.625 V
安裝類型: 表面貼裝
工作溫度: 0°C ~ 85°C
封裝/外殼: 484-BGA
供應(yīng)商設(shè)備封裝: 484-FBGA(23x23)
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Altera Corporation
55
APEX 20K Programmable Logic Device Family Data Sheet
IEEE Std.
1149.1 (JTAG)
Boundary-Scan
Support
All APEX 20K devices provide JTAG BST circuitry that complies with the
IEEE Std. 1149.1-1990 specification. JTAG boundary-scan testing can be
performed before or after configuration, but not during configuration.
APEX 20K devices can also use the JTAG port for configuration with the
Quartus II software or with hardware using either Jam Files (.jam) or Jam
Byte-Code Files (.jbc). Finally, APEX 20K devices use the JTAG port to
monitor the logic operation of the device with the SignalTap embedded
logic analyzer. APEX 20K devices support the JTAG instructions shown in
Table 19. Although EP20K1500E devices support the JTAG BYPASS and
SignalTap instructions, they do not support boundary-scan testing or the
use of the JTAG port for configuration.
Note to Table 19:
(1)
The EP20K1500E device supports the JTAG BYPASS instruction and the SignalTap instructions.
Table 19. APEX 20K JTAG Instructions
JTAG Instruction
Description
SAMPLE/PRELOAD
Allows a snapshot of signals at the device pins to be captured and examined during
normal device operation, and permits an initial data pattern to be output at the device
pins. Also used by the SignalTap embedded logic analyzer.
EXTEST
Allows the external circuitry and board-level interconnections to be tested by forcing a
test pattern at the output pins and capturing test results at the input pins.
BYPASS (1)
Places the 1-bit bypass register between the TDI and TDO pins, which allows the BST
data to pass synchronously through selected devices to adjacent devices during
normal device operation.
USERCODE
Selects the 32-bit USERCODE register and places it between the TDI and TDO pins,
allowing the USERCODE to be serially shifted out of TDO.
IDCODE
Selects the IDCODE register and places it between TDI and TDO, allowing the
IDCODE to be serially shifted out of TDO.
ICR Instructions
Used when configuring an APEX 20K device via the JTAG port with a MasterBlasterTM
or ByteBlasterMVTM download cable, or when using a Jam File or Jam Byte-Code File
via an embedded processor.
SignalTap Instructions
Monitors internal device operation with the SignalTap embedded logic analyzer.
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