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參數(shù)資料
| 型號： | DAC757IDGSR |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | QUAD, 12-BIT, LOW-POWER, VOLTAGE OUTPUT, I2C INTERFACE DIGITAL-TO-ANALOG CONVERTER |
| 中文描述： | 四，12位，低功耗，電壓輸出，I2C接口的數(shù)字模擬轉(zhuǎn)換器 |
| 文件頁數(shù)： | 2/31頁 |
| 文件大?。?/td> | 783K |
| 代理商： | DAC757IDGSR |
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www.ti.com
A1
A0
V
DD
SDA
1
2
3
4
5
6
7
8
10
9
V
OUT
A
V
OUT
B
GND
V
OUT
C
V
OUT
D
SCL
DAC7574
DAC7574
SLAS375–JUNE 2003
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
PRODUCT
PACKAGE
PACKAGE
DRAWING
NUMBER
SPECIFICATION
TEMPERATURE
RANGE
-40
°
C TO +105
°
C
PACKAGE
MARKING
ORDERING
NUMBER
TRANSPORT MEDIA
DAC7574
10-MSOP
DGS
D774
DAC7574IDGS
80 Piece Tube
DAC7574IDGSR
2500 Piece Tape and Reel
DGS PACKAGE
(TOPVIEW)
PIN DESCRIPTIONS
PIN
NAME
DESCRIPTION
1
V
OUT
A
V
OUT
B
Analog output voltage from DAC A
2
Analog output voltage from DAC B
Ground reference point for all circuitry on the
part
3
GND
4
V
OUT
C
V
OUT
D
SCL
Analog output voltage from DAC C
5
Analog output voltage from DAC D
6
Serial clock input
7
SDA
Serial data input and output
8
V
DD
A0
Analog voltage supply input
Device address select - I
2
C
Device address select - I
2
C
9
10
A1
ABSOLUTE MAXIMUM RATINGS
(1)
V
DD
to GND
Digital input voltage to GND
–0.3 V to +6 V
–0.3 V to V
DD
+ 0.3 V
–0.3 V to V
DD
+ 0.3 V
– 40
°
C to +105
°
C
V
OUT
to GND
Operating temperature range
Storage temperature range
– 65
°
C to +150
°
C
Junction temperature range (T
J
max)
Power dissipation:
+150
°
C
Thermal impedance (
Θ
JA)
270
°
C/W
Thermal impedance (
Θ
JC)
77
°
C/W
Lead temperature, soldering:
Vapor phase (60s)
215
°
C
Infrared (15s)
220
°
C
(1)
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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