參數(shù)資料
型號: CY7C1399B-12ZC
廠商: CYPRESS SEMICONDUCTOR CORP
元件分類: DRAM
英文描述: 32K x 8 3.3V Static RAM
中文描述: 32K X 8 CACHE SRAM, 12 ns, PDSO28
封裝: 8 X 13.40 MM, TSOP1-28
文件頁數(shù): 4/10頁
文件大小: 151K
代理商: CY7C1399B-12ZC
CY7C1399B
Document #: 38-05071 Rev. *C
Page 4 of 10
Switching Characteristics
Over the Operating Range
[6]
1399B-10
Min.
1399B-12
Min.
Parameter
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
Write Cycle
[9, 10]
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
HZWE
t
LZWE
Notes:
6.
Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
I
/I
and capacitance C
= 30 pF.
7.
At any given temperature and voltage condition, t
is less than t
, t
is less than t
, and t
is less than t
for any given device.
8.
t
, t
, t
are specified with C
= 5 pF as in AC Test Loads. Transition is measured ±500 mV from steady state voltage.
9.
The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. Both signals must be LOW to initiate a write and either signal can terminate
a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.
10. The minimum write cycle time for write cycle #3 (WE controlled, OE LOW) is the sum of t
HZWE
and t
SD
.
Description
Max.
Max.
Unit
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE LOW to Data Valid
OE LOW to Data Valid
OE LOW to Low Z
[7]
OE HIGH to High Z
[7, 8]
CE LOW to Low Z
[7]
CE HIGH to High Z
[7, 8]
CE LOW to Power-Up
CE HIGH to Power-Down
10
12
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
10
12
3
3
10
5
12
5
0
0
5
5
3
3
5
6
0
0
10
12
Write Cycle Time
CE LOW to Write End
Address Set-Up to Write End
Address Hold from Write End
Address Set-Up to Write Start
WE Pulse Width
Data Set-Up to Write End
Data Hold from Write End
WE LOW to High Z
[9]
WE HIGH to Low Z
[7]
10
8
7
0
0
7
5
0
12
8
8
0
0
8
7
0
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
7
7
3
3
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