
CY62138VN MoBL
Document #: 001-06513 Rev. **
Page 2 of 8
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage to Ground Potential...............–0.5V to +4.6V
DC Voltage Applied to Outputs
in High-Z State
[2]
....................................–0.5V to V
CC
 + 0.5V
DC Input Voltage
[2]
................................–0.5V to V
CC
 + 0.5V
Output Current into Outputs (LOW).............................20 mA
Static Discharge Voltage.......................................... > 2001V
(per MIL-STD-883, Method 3015)
Latch-up Current.................................................... > 200 mA
Operating Range
Device
CY62138VN Industrial
Range
Ambient 
Temperature
–40°C to +85°C 
V
CC
2.7V to 3.6V
Electrical Characteristics 
Over the Operating Range 
Parameter
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
Description
Test Conditions
CY62138VN
Typ.
[1]
Unit
V
V
V
V
μ
A
μ
A
Min.
2.4
Max.
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Leakage Current
Output Leakage Current
I
OH
 = -1.0 mA
I
OL
 = 2.1 mA
V
CC
 = 2.7V
V
CC
 = 2.7V
V
CC
 = 3.6V
V
CC
 = 2.7V
0.4
2.2
–0.5
–1
–1
V
CC
 + 0.5V
0.8
+1
+1
GND < V
I
 < V
CC
GND < V
O 
< V
CC
, Output 
Disabled
I
OUT
 = 0 mA,
f = f
MAX
 = 1/t
RC, 
CMOS Levels
I
OUT
 = 0 mA,
f = 1 MHz, 
CMOS Levels
CE > V
CC
 – 0.3V, 
V
IN
 > V
CC
 – 0.3V or 
V
IN
 < 0.3V, f = f
MAX
CE > V
CC 
– 0.3V
V
IN
 > V
CC 
– 0.3V 
or V
IN
 < 0.3V, f = 0
±1
+1
I
CC
V
CC
 Operating Supply 
Current 
V
CC
 = 3.6V
7
15
mA
1
2
mA
I
SB1
Automatic CE
Power-down Current— 
CMOS Inputs
Automatic CE 
Power-down Current— 
CMOS Inputs
V
CC
 = 3.6V
100
μ
A
I
SB2
V
CC
 = 3.6V
1
15
μ
A
Capacitance
[3] 
Parameter
Description
Test Conditions
Max.
Unit
C
IN
C
OUT
Input Capacitance
T
A
 = 25°C, f = 1 MHz,
V
CC
 = V
CC(typ)
6
pF
Output Capacitance
8
pF
Notes: 
2. V
(min) = –2.0V for pulse durations less than 20 ns.
3. Tested initially and after any design or process changes that may affect these parameters.
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