參數(shù)資料
型號(hào): C8051F005-TB
廠商: Silicon Laboratories Inc
文件頁數(shù): 85/171頁
文件大小: 0K
描述: BOARD PROTOTYPING W/C8051F005
標(biāo)準(zhǔn)包裝: 1
類型: MCU
適用于相關(guān)產(chǎn)品: C8051F005
所含物品:
C8051F000/1/2/5/6/7
C8051F010/1/2/5/6/7
2.
ABSOLUTE MAXIMUM RATINGS*
Ambient temperature under bias................................................................................................................. -55 to 125
C
Storage Temperature .................................................................................................................................. -65 to 150
C
Voltage on any Pin (except VDD and Port I/O) with respect to DGND ................................... -0.3V to (VDD + 0.3V)
Voltage on any Port I/O Pin or /RST with respect to DGND....................................................................-0.3V to 5.8V
Voltage on VDD with respect to DGND...................................................................................................-0.3V to 4.2V
Maximum Total current through VDD, AV+, DGND and AGND ..................................................................... 800mA
Maximum output current sunk by any Port pin ................................................................................................... 100mA
Maximum output current sunk by any other I/O pin ............................................................................................. 25mA
Maximum output current sourced by any Port pin .............................................................................................. 100mA
Maximum output current sourced by any other I/O pin ........................................................................................ 25mA
*Note: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of the devices at those or any other conditions above those
indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
3.
GLOBAL DC ELECTRICAL CHARACTERISTICS
-40
C to +85C unless otherwise specified.
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
Analog Supply Voltage
(Note 1)
2.7
3.0
3.6
V
Analog Supply Current
Internal REF, ADC, DAC, Comparators
all active
1
2
mA
Analog Supply Current with
analog sub-systems inactive
Internal REF, ADC, DAC, Comparators
all disabled, oscillator disabled
5
20
A
Analog-to-Digital Supply
Delta ( | VDD – AV+ | )
0.5
V
Digital Supply Voltage
2.7
3.0
3.6
V
Digital Supply Current with
CPU active
VDD = 2.7V, Clock=25MHz
VDD = 2.7V, Clock=1MHz
VDD = 2.7V, Clock=32kHz
12.5
0.5
10
mA
A
Digital Supply Current
(shutdown)
Oscillator not running
5
A
Digital Supply RAM Data
Retention Voltage
1.5
V
Specified Operating
Temperature Range
-40
+85
C
SYSCLK (System Clock
Frequency)
C8051F005/6/7, C8051F015/6/7
(Note 2)
0
25
MHz
SYSCLK (System Clock
Frequency)
C8051F000/1/2, C8051F010/1/2
(Note 2)
0
20
MHz
Tsysl (SYSCLK Low Time)
18
ns
Tsysh (SYSCLK High Time)
18
ns
Note 1: Analog Supply AV+ must be greater than 1V for VDD monitor to operate.
Note 2: SYSCLK must be at least 32 kHz to enable debugging.
Rev. 1.7
20
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