Application Notes
AN1006
2002 Teccor Electronics
Thyristor Product Catalog
AN1006 - 7
http://www.teccor.com
+1 972-580-7777
8. Set
Power Dissipation
to
2.2 W.
(
2 W
on 370) For sensitive
SCRs, set at 0.5 W. (
0.4 W
on 370)
9. Set
Horizontal
knob to
2 V/DIV
.
10. Set
Vertical
knob to
50 mA/DIV
.
11. Increase
Variable Collector Supply Voltage
until voltage
reaches 12 V on CRT.
12. After 12 V setting is completed, change
Horizontal
knob to
Step Generator
.
Procedure 7: I
GT
To measure the I
GT
parameter:
1. Set
Step/Offset Amplitude
to 20% of maximum rated I
GT
.
Note: R
GK
should be removed when testing I
GT
.
2. Set
Left-Right Terminal Jack Selector
to correspond with
location of the test fixture.
3. Gradually increase
Offset Multiplier
until device reaches
the conduction point. (Figure AN1006.9) Measure I
GT
by fol-
lowing horizontal axis to the point where the vertical line
crosses axis. This measured value is I
GT
. (On 370, I
GT
will be
numerically displayed on screen under offset value.)
Figure AN1006.9
I
GT
= 25 μA
Procedure 8: V
GT
To measure the V
GT
parameter:
1. Set
Offset Multiplier
to
0
(zero). (Press
Aid
and O
ppose
at
the same time on 370.)
2. Set
Step Offset Amplitude
to 20% rated V
GT
.
3. Set
Left-Right Terminal Jack Selector
to correspond with
location of test fixture.
4. Gradually increase
Offset Multiplier
until device reaches
the conduction point. (Figure AN1006.10) Measure V
GT
by
following horizontal axis to the point where the vertical line
crosses axis. This measured value is V
GT
. (On 370, V
GT
will
be numerically displayed on screen, under offset value.)
Procedure 9:
GT
will be numerically displayed on screen
under offset value.)
Figure AN1006.10 V
GT
= 580 mV
Triacs
Triacs are full-wave bidirectional AC switches turned on when
current is supplied to the gate terminal of the device. If gate con-
trol in all four quadrants is required, then a sensitive gate triac is
needed, whereas a standard triac can be used if gate control is
only required in Quadrants I through III.
To connect the triac:
1. Connect the
Gate
to the
Base Terminal
(B).
2. Connect
MT1
to the
Emitter Terminal
(E).
3. Connect
MT2
to the
Collector Terminal
(C).
To begin testing, perform the following procedures.
Procedure 1: (+)V
DRM
, (+)I
DRM
, (-)V
DRM
, (-)I
DRM
Note: The (+) and (-) symbols are used to designate the polarity
MT2 with reference to MT1.
To measure the (+)V
DRM
, (+)I
DRM
, (-)V
DRM
, and (-)I
DRM
parameter:
1. Set
Variable Collector Supply Voltage Range
to appropri-
ate
Max Peak Volts
for device under test. (Value selected
should be equal to the device’s V
DRM
rating.)
WARNING: Do NOT exceed V
DRM
/V
RRM
rating of SCRs, tri-
acs, or
Quadracs
. These devices can be damaged.
2. Set
Horizontal
knob to sufficient scale to allow viewing of
trace at the required voltage level. (The
100 V/DIV
scale
should be used for testing devices having a V
DRM
rating of
600 V or greater; the
50 V/DIV
scale for testing parts rated
from 30 V to 500 V, and so on.)
3. Set
Mode
to
Leakage
.
4. Set
Polarity
to (+).
5. Set
Power Dissipation
to
0.5 W
. (
0.4 W
on 370)
6. Set
Terminal Selector
to
Emitter Grounded-Open Base
.
7. Set
Vertical
knob to ten times the maximum leakage current
(I
DRM
) specified for the device.
Note: The CRT screen readout should show 1% of the maxi-
mum leakage current. The vertical scale is divided by 1,000
when leakage mode is used.
50
mA
PER
V
E
R
T
DIV
PER
H
O
R
I
Z
DIV
PER
S
T
E
P
IGT
()k
DIV
9m
PER
DIV
10
A
5 K
50
mA
PER
V
E
R
T
DIV
PER
H
O
R
I
Z
DIV
PER
S
T
E
P
VGT
200
mV
250m
()k
DIV
9m
PER
DIV