參數(shù)資料
型號(hào): AS8F128K32
廠(chǎng)商: Austin Semiconductor, Inc
英文描述: 128K x 32 FLASH FLASH MEMORY ARRAY
中文描述: 128K的× 32閃光的閃存陣列
文件頁(yè)數(shù): 13/22頁(yè)
文件大小: 394K
代理商: AS8F128K32
FLASH
AS8F128K32
Austin Semiconductor, Inc.
AS8F128K32
Rev. 2.0 5/03
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
13
AC CHARACTERISTICS
JEDEC Standard
Read Cycle Time
1
t
AVAV
t
RC
Min
60 70 90 120 150
ns
Address to Output Delay
t
AVQV
t
ACC
CEx\ = V
IL
OE\ = V
IL
Max
60 70 90 120 150
ns
Chip Enable to Output Delay
t
ELQV
t
CE
Max
60 70 90 120 150
ns
Output Enable to Output Delay
t
GLQV
t
OE
Max
30 35 40
50
55
ns
Chip Enable to Output High Z
1,2
Output Enable to Output High Z
1,2
t
EHQZ
t
DF
Max
20 20 25
30
35
ns
t
GHQZ
t
DF
Max
20 20 25
30
35
ns
Read
Min
ns
Toggle and
Data Polling
Min
ns
Output Hold Time From Addresses
CEx\ or OE\, Whichever Comes First
Erase and Program Operations
t
AXQX
t
OH
Min
ns
Write Cycle Time
1
t
AVAV
t
WC
Min
60 70 90 120 150
ns
Address Setup Time
t
AVWL
t
AS
Min
ns
Address Hold Time
t
WLAX
t
AH
Min
45 45 45
50
50
ns
Data Setup Time
t
DVWH
t
DS
Min
30 30 45
50
50
ns
Data Hold Time
Read Recover Time Before Write
(OE\ High to WEx\ Low)
CEx\ Setup Time
t
WHDX
t
DH
Min
ns
t
GHWL
t
GHWL
Min
ns
t
ELWL
t
CS
Min
ns
CEx\ Hold Time
t
WHEH
t
CH
Min
ns
Write Pulse Width
t
WLWH
t
WP
Min
30 35 45
50
50
ns
Write Pulse Width High
t
WHWL
t
WPH
Min
ns
Byte Programming Operation
4
Sector Erase Operation
4
V
CC
Setup Time
1
t
WHWH1
t
WHWH1
TYP
μs
t
WHWH2
t
WHWH2
TYP
sec
t
VCS
Min
μs
-150
SYMBOL
TEST SETUP
PARAMETER
-60
UNIT
Output Enable Hold Time
1
Read-Only Operations
t
OEH
10
0
-70 -90 -120
0
0
0
0
1.0
50
0
0
20
14
NOTES:
1. Not 100% tested.
2. Output Driver Disable Time.
3. See Figure 7 and Table 6 for test specifications.
4. See the “Erase and Programming Performance” section for more information.
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