參數(shù)資料
型號: AS7C513B-20TI
廠商: ALLIANCE SEMICONDUCTOR CORP
元件分類: DRAM
英文描述: 5V 32K x 16 CMOS SRAM
中文描述: 32K X 16 STANDARD SRAM, 20 ns, PDSO44
封裝: 18.40 X 10.20 MM, TSOP2-44
文件頁數(shù): 6/9頁
文件大小: 213K
代理商: AS7C513B-20TI
AS7C513B
3/26/04, v.1.3
Alliance Semiconductor
P. 6 of 9
Write waveform 2 (CE controlled)
11
AC test conditions
- Output load: see Figure B.
- Input pulse level: GND to 3.5V. See Figure A.
- Input rise and fall times: 2 ns. See Figure A.
- Input and output timing reference levels: 1.5V.
Notes
1
2
3
4
5
6
7
8
9
10 Not applicable.
11
All write cycle timings are referenced from the last valid address to the first transitioning address.
12 Not applicable.
13 C=30pF, except on High Z and Low Z parameters, where C=5pF.
During V
CC
power-up, a pull-up resistor to V
CC
on CE is required to meet I
SB
specification.
This parameter is sampled, but not 100% tested.
For test conditions, see
AC Test Conditions
, Figures A and B.
These parameters are specified with C
L
= 5pF, as in Figure B. Transition is measured
±
500mV from steady-state voltage.
This parameter is guaranteed, but not 100% tested.
WE is High for read cycle.
CE and OE are Low for read cycle.
Address valid prior to or coincident with CE transition Low.
All read cycle timings are referenced from the last valid address to the first transitioning address.
Address
CE
LB, UB
WE
Data IN
t
WC
t
CW
t
BW
t
WP
t
DW
t
DH
t
OW
t
WZ
t
AH
Data OUT
Data undefined
High-Z
High-Z
t
AS
t
AW
Data valid
t
CLZ
t
WR
&
255
C
13
480
D
out
GND
+5.0V
Figure B: 5.0V Output load
168
Thevenin equivalent:
D
out
+1.728V
10%
90%
10%
90%
GND
+3.5V
Figure A: Input pulse
2 ns
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