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參數(shù)資料
| 型號(hào)： | AD5310BRTZ-REEL7 |
| 廠商： | Analog Devices Inc |
| 文件頁(yè)數(shù)： | 2/16頁(yè) |
| 文件大小： | 0K |
| 描述： | IC DAC 10BIT R-R W/BUFF SOT23-6 |
| 產(chǎn)品培訓(xùn)模塊： | Data Converter Fundamentals DAC Architectures |
| 標(biāo)準(zhǔn)包裝： | 3,000 |
| 設(shè)置時(shí)間： | 6µs |
| 位數(shù)： | 10 |
| 數(shù)據(jù)接口： | 串行 |
| 轉(zhuǎn)換器數(shù)目： | 1 |
| 電壓電源： | 單電源 |
| 功率耗散（最大）： | 1.25mW |
| 工作溫度： | -40°C ~ 105°C |
| 安裝類(lèi)型： | 表面貼裝 |
| 封裝/外殼： | SOT-23-6 |
| 供應(yīng)商設(shè)備封裝： | SOT-23-6 |
| 包裝： | 帶卷 (TR) |
| 輸出數(shù)目和類(lèi)型： | 1 電壓，單極；1 電壓，雙極 |
| 采樣率（每秒）： | 167k |
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AD5310
Data Sheet
Rev. B | Page 10 of 16
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer function.
A typical INL vs. code plot is shown in Figure 5.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed mono-
tonic by design. A typical DNL vs. code plot is shown in Figure 6.
Zero Code Error
Zero code error is a measure of the output error when zero code
(000 hex) is loaded to the DAC register. Ideally, the output should
be 0 V. The zero code error is always positive in the AD5310
because the output of the DAC cannot go below 0 V. It is due to
a combination of the offset errors in the DAC and output amplifier.
Zero code error is expressed in mV. A plot of zero code error vs.
temperature is shown in Figure 9.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (3FF Hex) is loaded to the DAC register. Ideally, the output
should be VDD 1 LSB. Full-scale error is expressed as a percentage
of the full-scale range. A plot of full-scale error vs. temperature
is shown in Figure 9.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal expressed as a percentage of the full-scale range.
Total Unadjusted Error
Total unadjusted error (TUE) is a measure of the output error
that takes all the various errors into account. A typical TUE vs.
code plot is shown in Figure 7.
Zero Code Error Drift
Zero code error drift is a measure of the change in zero code
error with a change in temperature. It is expressed in V/°C.
Gain Error Drift
Gain error drift is a measure of the change in gain error with
changes in temperature. It is expressed in (ppm of full-scale
range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s and
is measured when the digital input code is changed by 1 LSB at
the major carry transition (1FF hex to 200 hex). See Figure 22.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into the
analog output of the DAC from the digital inputs of the DAC
but is measured when the DAC output is not updated. It is specified
in nV-s and is measured with a full-scale code change on the
data bus, that is, from all 0s to all 1s and vice versa.
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