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參數(shù)資料
| 型號： | 74ETL16245 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | 16-Bit Data Transceiver with Incident Wave Switching |
| 中文描述： | 16位數(shù)據(jù)收發(fā)器事件波開關(guān) |
| 文件頁數(shù)： | 7/10頁 |
| 文件大?。?/td> | 190K |
| 代理商： | 74ETL16245 |
Skew
Symbol
Parameter
74ETL
54ETL
Units
Conditions
T
A
e b
40
§
C to
a
85
§
C
V
CC
e
4.5V–5.5V
16 Outputs Switching
T
A
e b
55
§
C to
a
125
§
C
V
CC
e
4.5V–5.5V
16 Outputs Switching
Max
Max
t
OHS
(Notes 1, 2)
Pin-to-Pin Skew
LH/HL An to Bn
1.3
ns
Figures 1, 2, 4
t
OHS
(Notes 1, 2)
Pin-to-Pin Skew
LH/HL Bn to An
1.3
ns
Figures 1, 2, 4
t
PS
(Notes 1, 2)
Duty Cycle Skew
Bn to An
2.0
ns
Figures 1, 2, 4
t
PS
(Notes 1, 2)
Duty Cycle Skew
An to Bn
2.0
ns
Figures 1, 2, 4
VME Extended Skew
Symbol
Parameter
74ETL
54ETL
Units
Conditions
T
A
e b
40
§
C to
a
85
§
C
V
CC
e
4.5V–5.5V
16 Outputs Switching
T
A
e b
55
§
C to
a
125
§
C
V
CC
e
4.5V–5.5V
16 Outputs Switching
Max
Max
t
PV
(Notes 1, 2)
Device-to-Device Skew LH/HL
Transitions Bn to An
4.0
ns
Figures 1, 2, 4
t
CP
(Notes 1, 2)
Device-to-Device Skew LH/HL
Transitions An to Bn
2.5
ns
Figures 1, 2, 4
t
CP
(Note 1, 3)
Change in Propagation Delay
with Load Bn to An
4.0
ns
Figures 1, 2, 4
t
CPV
(Notes 1, 2, 3)
Device-to-Device, Change
in Propagation Delay with
with Load Bn to An
6.0
ns
Figures 1, 2, 4
Note 1:
Skew is defined as the absolute difference in delay between two outputs. The specification applies to any outputs switching HIGH to LOW, LOW to HIGH,
or any combination switching HIGH-to-LOW or LOW-to-HIGH. This specification is guaranteed but not tested.
Note 2:
This is measured with both devices at the same value of V
CC
g
1% and with package temperature differences of 20
§
C from each other.
Note 3:
This is measured with Rx in Figure 1 at 13
X
for one unit and at 56
X
for the other unit.
Capacitance
Symbol
Parameter
Typ
Max
Units
Conditions, T
A
e
25
§
C
C
IN
Input Capacitance
5
8
pF
V
CC
e
0.0V (OE
n
, DIR)
C
I/O
(Note 1)
Output Capacitance
9
12
pF
V
CC
e
5.0V (A
n
)
Note 1:
C
I/O
is measured at frequency f
e
1 MHz, per MIL-STD-883B, Method 3012.
7
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