參數(shù)資料
型號(hào): 2MBI1200U4G-120
廠商: FUJI ELECTRIC CO LTD
元件分類: IGBT 晶體管
英文描述: IGBT-Module
中文描述: 1200 A, 1200 V, N-CHANNEL IGBT
封裝: M248, 10 PIN
文件頁數(shù): 6/14頁
文件大小: 595K
代理商: 2MBI1200U4G-120
Tentative
(Under developmemt)
H04-004-003
T
F
l
t
t
D
11.Reliability test results
14
6
MT5F16507
Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
Reference
norms
EIAJ ED-4701
(Aug.-2001 edition)
Number
of sample
Accept-
ance
number
1 Terminal Strength
(Pull test)
2 Mounting Strength
Pull force
Test time
Screw torque
: 40N
:
10±1 sec.
:
1.8 ~ 2.1 N·m (M4)
4.25 ~ 5.75 N·m (M6)
8.0~ 10.0 N·m (M8)
:
10±1 sec.
Test Method 401
5
( 0 : 1 )
Method
Test Method 402
Method
5
( 0 : 1 )
Test time
Range of frequency : 10 ~ 500Hz
Sweeping time
Acceleration
Sweeping direction : Each X,Y,Z axis
Test time
Maximum acceleration
Pulse width
Direction
Test time
Storage temp.
Test duration
Storage temp.
Test duration
Storage temp.
Relative humidity
Test duration
Test temp.
Test humidity
Test duration
3 Vibration
Test Method 403
Reference 1
5
( 0 : 1 )
: 15 min.
: 100m/s
2
Condition code B
: 6 hr. (2hr./direction)
: 1000m/s
2
: 6.0msec.
: Each X,Y,Z axis
: 3 times/direction
:
125±5
: 1000hr.
:
-40±5
: 1000hr.
:
85±2
:
85±5%
: 1000hr.
: 120
±
2
:
85±5%
: 96hr.
4 Shock
Test Method 404
Condition code A
5
( 0 : 1 )
1 High Temperature
Storage
2 Low Temperature
Storage
3 Temperature
Humidity
Storage
4 Unsaturated
Pressurized Vapor
Test Method 201
5
( 0 : 1 )
Test Method 202
5
( 0 : 1 )
Test Method 103
Test code C
5
( 0 : 1 )
Test Method 103
Test code E
5
( 0 : 1 )
5 Temperature
Cycle
Test Method 105
5
( 0 : 1 )
Test temp.
: Low temp. -40
±
5
High temp. 125
±
5
RT 5 ~ 35
: High ~ RT ~ Low ~ RT
1hr. 0.5hr. 1hr. 0.5hr.
: 100 cycles
+0
: High temp. 100
-5
+5
Low temp. 0
-0
Dwell time
Number of cycles
6 Thermal Shock
Test Method 307
5
( 0 : 1 )
Test temp.
Method
Condition code A
Used liquid : Water with ice and boiling water
Dipping time
Transfer time
Number of cycles
: 5 min. par each temp.
: 10 sec.
: 10 cycles
M
E
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