參數(shù)資料
型號(hào)： ZL50023GAC
廠商： ZARLINK SEMICONDUCTOR INC
元件分類： 路由/交換
英文描述： Enhanced 4 K Digital Switch
中文描述： TELECOM, DIGITAL TIME SWITCH, PBGA256
封裝： 17 X 17 MM, 1.61 MM HEIGHT, PLASTIC, MS-034, BGA-256
文件頁(yè)數(shù)： 34/80頁(yè)
文件大小： 1341K
代理商： ZL50023GAC
ZL50023
Data Sheet
34
Zarlink Semiconductor Inc.
18.1 Test Access Port (TAP)
The Test Access Port (TAP) accesses the ZL50023 test functions. It consists of three input pins and one output pin
as follows:
Test Clock Input (TCK)
- TCK provides the clock for the test logic. TCK does not interfere with any on-chip
clock and thus remains independent in the functional mode. TCK permits shifting of test data into or out of
the Boundary-Scan register cells concurrently with the operation of the device and without interfering with
the on-chip logic.
Test Mode Selection Inputs (TMS)
- The TAP Controller uses the logic signals received at the TMS input to
control test operations. The TMS signals are sampled at the rising edge of the TCK pulse. This pin is
internally pulled to high when it is not driven from an external source.
Test Data Input (TDi)
- Serial input data applied to this port is fed either into the instruction register or into a
test data register, depending on the sequence previously applied to the TMS input. The registers are
described in a subsequent section. The received input data is sampled at the rising edge of the TCK pulse.
This pin is internally pulled to high when it is not driven from an external source.
Test Data Output (TDo)
- Depending on the sequence previously applied to the TMS input, the contents of
either the instruction register or test data register are serially shifted out towards TDo. The data from TDo is
clocked on the falling edge of the TCK pulses. When no data is shifted through the boundary scan cells, the
TDo driver is set to a high impedance state.
Test Reset (TRST)
- Resets the JTAG scan structure. This pin is internally pulled to high when it is not
driven from an external source.
18.2 Instruction Register
The ZL50023 uses the public instructions defined in the IEEE-1149.1 standard. The JTAG interface contains a
four-bit instruction register. Instructions are serially loaded into the instruction register from the TDi when the TAP
Controller is in its shifted-OR state. These instructions are subsequently decoded to achieve two basic functions: to
select the test data register that may operate while the instruction is current and to define the serial test data
register path that is used to shift data between TDi and TDo during data register scanning.
18.3 Test Data Registers
As specified in the IEEE-1149.1 standard, the ZL50023 JTAG interface contains three test data registers:
The Boundary-Scan Register
- The Boundary-Scan register consists of a series of boundary-scan cells
arranged to form a scan path around the boundary of the ZL50023 core logic.
The Bypass Register
- The Bypass register is a single stage shift register that provides a one-bit path from
TDi to TDo.
The Device Identification Register
- The JTAG device ID for the ZL50023 is 0C36714B
H
18.4 BSDL
A Boundary Scan Description Language (BSDL) file is available from Zarlink Semiconductor to aid in the use of the
IEEE-1149.1 test interface.
Version
<31:28>
0000
Part Number
<27:12>
1100 0011 0110
0111
Manufacturer ID
<11:1>
0001 0100 101
LSB
<0>
1
相關(guān)PDF資料
PDF描述
ZL50023QCC Enhanced 4 K Digital Switch
ZL50030 Flexible 4 K x 2 K Channel Digital Switch with H.110 Interface and 1 K x 1 K Local Switch
ZL50030GAC Flexible 4 K x 2 K Channel Digital Switch with H.110 Interface and 1 K x 1 K Local Switch
ZL50031 Flexible 4 K x 2 K Channel Digital Switch with H.110 Interface and 2 K x 2 K Local Switch
ZL50031QEG1 Flexible 4 K x 2 K Channel Digital Switch with H.110 Interface and 2 K x 2 K Local Switch
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
ZL50023GAG2 制造商:Microsemi Corporation 功能描述:SWIT FABRIC 4K X 4K 1.8V/3.3V 256BGA - Trays 制造商:Microsemi Corporation 功能描述:PB FREE PARALLEL ACCESS CIRCUIT (PAC) 制造商:MICROSEMI CONSUMER MEDICAL PRODUCT GROUP 功能描述:IC TDM SWITCH 4K-CH ENH 256PBGA 制造商:Microsemi Corporation 功能描述:IC TDM SWITCH 4K-CH ENH 256PBGA
ZL50023QCC 制造商:Microsemi Corporation 功能描述: 制造商:Microsemi Corporation 功能描述:4K WITH RATE CONVERSION - Trays
ZL50023QCG1 制造商:Microsemi Corporation 功能描述:PB FREE 4K WITH RATE CONVERSION 制造商:Microsemi Corporation 功能描述:PB FREE 4K WITH RATE CONVERSION - Trays 制造商:MICROSEMI CONSUMER MEDICAL PRODUCT GROUP 功能描述:IC TDM SWITCH 4K-CH ENH 256LQFP 制造商:Microsemi Corporation 功能描述:IC TDM SWITCH 4K-CH ENH 256LQFP
ZL50030 制造商:ZARLINK 制造商全稱:Zarlink Semiconductor Inc 功能描述:Flexible 4 K x 2 K Channel Digital Switch with H.110 Interface and 1 K x 1 K Local Switch
ZL50030_06 制造商:ZARLINK 制造商全稱:Zarlink Semiconductor Inc 功能描述:Flexible 4 K x 2 K Channel Digital Switch with H.110 Interface and 1 K x 1 K Local Switch
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。

采購(gòu)需求

(若只采購(gòu)一條型號(hào)，填寫(xiě)一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

*型號(hào) *數(shù)量 廠商 批號(hào) 封裝
添加更多采購(gòu)

我的聯(lián)系方式

*
*
*