參數(shù)資料
型號: XCS40
廠商: Xilinx, Inc.
英文描述: Field Programmable Gate Arrays(現(xiàn)場可編程門陣列)
中文描述: 現(xiàn)場可編程門陣列(現(xiàn)場可編程門陣列)
文件頁數(shù): 49/66頁
文件大?。?/td> 716K
代理商: XCS40
R
DS060 (v1.5) March 2, 2000
4-49
Spartan and Spartan-XL Families Field Programmable Gate Arrays
Spartan-XL CLB RAM Synchronous (Edge-Triggered) Write Operation Guidelines (cont.)
Testing of switching parameters is modeled after testing methods specified by MIL-M-38510/605. All devices are 100%
functionally tested. Internal timing parameters are derived from measuring internal test patterns. Listed below are
representative values. For more specific, more precise, and worst-case guaranteed data, use the values reported by the
static timing analyzer (TRCE in the Xilinx Development System) and back-annotated to the simulation netlist. All timing
parameters assume worst-case operating conditions (supply voltage and junction temperature). Values apply to all
Spartan-XL devices and are expressed in nanoseconds unless otherwise noted.
Spartan-XL CLB RAM Synchronous (Edge-Triggered) Write Timing
Dual Port RAM
Speed Grade
-5
-4
Units
Size
1
Symbol
Min
Max
Min
Max
Write Operation
Address write cycle time (clock K period)
Clock K pulse width (active edge)
Address setup time before clock K
DIN setup time before clock K
WE setup time before clock K
All hold times after clock K
Data valid after clock K
16x1
16x1
16x1
16x1
16x1
16x1
16x1
T
WCDS
T
WPDS
T
ASDS
T
DSDS
T
WSDS
T
WODS
7.7
3.1
1.3
1.7
1.4
0.0
5.2
8.4
3.6
1.5
2.0
1.6
0.0
6.1
ns
ns
ns
ns
ns
ns
ns
Note 1: Read Operation Timing for 16x1 dual-port RAM option is identical to 16x2 single-port RAM timing.
WCLK (K)
WE
ADDRESS
DATA IN
T
DSDS
T
DHDS
T
ASDS
T
AHDS
T
WSDS
T
WPDS
T
WHDS
X6474
DATA OUT
OLD
NEW
T
WODS
T
ILO
T
ILO
X6461
WCLK (K)
WE
ADDRESS
DATA IN
DATA OUT
OLD
NEW
T
DSS
T
DHS
T
ASS
T
AHS
T
WSS
T
WPS
T
WHS
T
WOS
T
ILO
T
ILO
Single Port
Dual Port
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