參數(shù)資料
型號: W19B322MTB9G
廠商: WINBOND ELECTRONICS CORP
元件分類: PROM
英文描述: 2M X 16 FLASH 3V PROM, 90 ns, PBGA48
封裝: TFBGA-48
文件頁數(shù): 30/52頁
文件大?。?/td> 1955K
代理商: W19B322MTB9G
W19B32XMT/B
- 36 -
8. DC CHARACTERISTICS
8.1 Absolute Maximum Ratings
PARAMETER
RATING
UNIT
Storage Temperature Plastic Packages
-65 to +150
°C
Ambient Temperature with Power Applied
-65 to +125
°C
Voltage with Respect to Ground VDD (Note 1)
-0.5 to +4.0
V
A9, #OE, and #RESET (Note 2)
-0.5 to +12.5
V
#WP/ACC
-0.5 to +10.5
V
All other pins (Note 1)
-0.5 to VDD+0.5
V
Output Short Circuit Current (Note 3)
200
mA
Notes:
1. Minimum DC voltage on input or I/O pins is -0.5 V. During voltage transitions, input or I/O pins may overshoot VSS to
-
2.0 V for periods of up to 20 ns. Maximum DC voltage on input or I/O pins is VDD +0.5 V. During voltage transitions,
input or I/O pins may overshoot to VDD +2.0 V for periods up to 20 nS.
2. Minimum DC input voltage on pins A9, #OE, #RESET, and #WP/ACC is -0.5 V. During voltage transitions, A9, #OE,
#WP/ACC, and #RESET may overshoot VSS to -2.0 V for periods of up to 20 nS. Maximum DC input voltage on pin A9
is +12.5 V which may overshoot to +14.0 V for periods up to 20 ns. Maximum DC input voltage on #WP/ACC is +9.5 V
which may overshoot to +12.0 V for periods up to 20 nS.
3. No more than one output may be shorted to ground at a time. Duration of the short circuit should not be greater than
one second.
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
This is a stress rating only; functional operation of the device at these or any other conditions above those
indicated in the operational sections of this data sheet is not implied. Exposure of the device to absolute maximum
rating conditions for extended periods may affect device reliability.
8.2 Operating Ranges
PARAMETER
RATING
UNIT
Industrial Grade
-40 to +85
Ambient Temperature (TA)
Extended Grade
-20 to +85
°C
VDD Supply Voltages
VDD for standard voltage range
2.75 to 3.6
V
Operating ranges define those limits between which the functionality of the device is guaranteed.
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