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18
VP16256
ELECTRICAL CHARACTERISTICS
The Electrical Characteristics are guaranteed over the following range of operating conditions, unless otherwise stated:
T
AMB
= 0
°
C to
1
70
°
C, T
J
=
1
120
°
C, V
DD
=
1
5V
±
10%, GND = 0V
Static Characteristics
Min.
Typ.
Max.
Output high voltage
Output low voltage
Input high voltage (CMOS)
Input low voltage (CMOS)
Input high voltage (TTL)
Input low voltage (TTL)
Input leakage current
Input capacitance
Output leakage current
Output short circuit current
10
-
0·4
-
1·0
-
0·8
1
10
1
50
300
2·4
-
3·5
-
2·0
-
2
10
2
50
10
V
OH
V
OL
V
IH
V
IL
V
IH
V
IL
I
IN
C
IN
I
OZ
I
OS
I
OH
= 4mA
I
OH
= 4mA
SCLK input only
SCLK input only
All other inputs
All other inputs
GND < V
IN
< V
DD
GND < V
OUT
< V
DD
V
DD
=
1
5·5V
V
V
V
V
V
V
μ
A
pF
μ
A
mA
Units
Value
Conditions
Characteristic
Symbol
Min.
Typ. Max.
Min.
Typ.
Max.
Input signal setup to clock rising edge
Input signal hold after clock rising edge
OEN set up to clock rising edge
OEN hold after clock rising edge
Clock rising edge to output signal valid
Clock frequency
Clock high time
Clock low time
Clock to data valid F bus from high impedance
Clock to data high impedance F bus
V
DD
current
ns
ns
ns
ns
ns
MHz
ns
ns
ns
ns
mA
290
-
-
-
-
18
27
-
-
35
35
325
8
0
20
4
5
-
14
14
-
-
t
HS
t
HH
t
OS
t
OH
t
CD
f
SCLK
t
CH
t
CL
t
CVF
t
CZF
I
DD
395
-
-
-
-
17
40
-
-
23
23
450
7
0
20
4
5
-
10
10
-
-
30pF
See Fig. 22
See Fig. 22
See Note 1
NOTE 1. V
DD
=
1
5·5V, outputs unloaded, clock frequency = Max.
VP16256-27
VP16256-40
Conditions
Units
Characteristic
Symbol
Switching Characteristics (see Figs. 19, 20 and 21)
Fig. 22 Three state delay measurement
V
H
0·5V
Delay from
output high
to output
high impedance
0·5V
0·5V
0·5V
V
L
1·5V
1·5V
Delay from
output low
to output
high impedance
Delay from
output high
impedance to
output low
Delay from
output high
impedance to
output high
Test
Waveform measurement level
V
is the voltage reached when the output is driven high
VL is the voltage reached when the output is driven low
I
OL
1·5V
I
OH
DUT
30pF
Three state delay measurement load