μPD78F921x ONLY) User’s Manual U16994EJ6V0UD 172 (5) Full-scale error This sh" />
參數(shù)資料
型號: UPD78F9512GR-JJG-A
廠商: Renesas Electronics America
文件頁數(shù): 84/175頁
文件大?。?/td> 0K
描述: MCU 8BIT SGL CHIP 16PIN
標準包裝: 400
系列: 78K0S/Kx1+
核心處理器: 78K0S
芯體尺寸: 8-位
速度: 10MHz
外圍設(shè)備: LVD,POR,PWM,WDT
輸入/輸出數(shù): 13
程序存儲器容量: 4KB(4K x 8)
程序存儲器類型: 閃存
RAM 容量: 128 x 8
電壓 - 電源 (Vcc/Vdd): 2 V ~ 5.5 V
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 85°C
封裝/外殼: 16-SSOP(0.173",4.40mm 寬)
包裝: 托盤
CHAPTER 9 A/D CONVERTER (
μPD78F921x ONLY)
User’s Manual U16994EJ6V0UD
172
(5) Full-scale error
This shows the difference between the actual measurement value of the analog input voltage and the theoretical
value (Full-scale
3/2LSB) when the digital output changes from 1......110 to 1......111.
(6) Integral linearity error
This shows the degree to which the conversion characteristics deviate from the ideal linear relationship. It
expresses the maximum value of the difference between the actual measurement value and the ideal straight line
when the zero-scale error and full-scale error are 0.
(7) Differential linearity error
While the ideal width of code output is 1LSB, this indicates the difference between the actual measurement value
and the ideal value.
Figure 9-15. Zero-Scale Error
Figure 9-16. Full-Scale Error
111
011
010
001
Zero-scale error
Ideal line
000
01
2
3
VDD
Digital
output
(Lo
w
er
3
bits)
Analog input (LSB)
111
110
101
000
0
VDD
3
Full-scale error
Ideal line
Analog input (LSB)
Digital
output
(Lo
w
er
3
bits)
VDD
2VDD1
VDD
Figure 9-17. Integral Linearity Error
Figure 9-18. Differential Linearity Error
0
VDD
Digital
output
Analog input
Integral linearity
error
Ideal line
1……1
0……0
0
VDD
Digital
output
Analog input
Differential
linearity error
1……1
0……0
Ideal 1LSB width
(8) Conversion time
This expresses the time from the start of sampling to when the digital output is obtained.
The sampling time is included in the conversion time in the characteristics table.
(9) Sampling time
This is the time the analog switch is turned on for the analog voltage to be sampled by the sample & hold circuit.
Sampling
time
Conversion time
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