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參數(shù)資料
| 型號： | UPD44323362 |
| 廠商： | NEC Corp. |
| 英文描述： | 32M-BIT CMOS SYNCHRONOUS FAST STATIC RAM 1M-WORD BY 36-BIT HSTL INTERFACE / REGISTER-REGISTER / LATE WRITE |
| 中文描述： | 32兆位CMOS同步快速靜態(tài)RAM的100萬字的36位HSTL接口/寄存器間/晚寫 |
| 文件頁數(shù)： | 20/28頁 |
| 文件大?。?/td> | 252K |
| 代理商： | UPD44323362 |
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20
Data Sheet M16379EJ4V0DS
μ
PD44323362
TAP Controller State Diagram
Test-Logic-Reset
Run-Test / Idle
Select-DR-Scan
Capture-DR
Capture-IR
Shift-DR
Exit1-DR
Pause-DR
Exit2-DR
Update-DR
Update-IR
Exit2-IR
Pause-IR
Exit1-IR
Shift-IR
Select-IR-Scan
0
0
0
1
0
1
1
0
0
1
0
1
1
0
0
0
0
1
0
1
0
1
1
1
0
1
1
0
1
0
1
1
Disabling The Test Access Port
It is possible to use this device without utilizing the TAP. To disable the TAP Controller without interfering with
normal operation of the device, TCK must be tied to V
SS
to preclude mid level inputs.
TDI and TMS are designed so an undriven input will produce a response identical to the application of a logic 1, and
may be left unconnected. But they may also be tied to V
DD
through a 1k
resistor.
TDO should be left unconnected.
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