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參數(shù)資料
| 型號(hào)： | TMP93CW41DF |
| 廠商： | Toshiba Corporation |
| 元件分類： | 微控制器 |
| 英文描述： | Lens Cap; Leaded Process Compatible:Yes RoHS Compliant: Yes |
| 中文描述： | 質(zhì)量與可靠性保證/操作注意事項(xiàng) |
| 文件頁數(shù)： | 46/48頁 |
| 文件大?。?/td> | 390K |
| 代理商： | TMP93CW41DF |
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Quality and Reliability Assurance / Handling Precautions
030901
QUA-46
2002-02-20
4.6.3 Corrosive Gases
Corrosive gases can cause chemical reactions in devices, degrading device
characteristics.
For example, sulphur-bearing corrosive gases emanating from rubber placed
near a device (accompanied by condensation under high-humidity conditions)
can corrode a device’s leads. The resulting chemical reaction between leads
forms foreign particles which can cause electrical leakage.
4.6.4 Radioactive and Cosmic Rays
Most industrial and consumer semiconductor devices are not designed with
protection against radioactive and cosmic rays. Devices used in aerospace
equipment or in radioactive environments must therefore be shielded.
4.6.5 Strong Electrical and Magnetic Fields
Devices exposed to strong magnetic fields can undergo a polarization
phenomenon in their plastic material, or within the chip, which gives rise to
abnormal symptoms such as impedance changes or increased leakage current.
Failures have been reported in LSIs mounted near malfunctioning deflection
yokes in TV sets. In such cases, the device’s installation location must be
changed or the device must be shielded against the electrical or magnetic field.
Shielding against magnetism is especially necessary for devices used in an
alternating magnetic field because of the electromotive forces generated in this
type of environment.
4.6.6 Interference from Light (ultraviolet rays, sunlight, fluorescent
lamps and incandescent lamps)
Light striking a semiconductor device generates electromotive force due to
photoelectric effects. In some cases the device can malfunction. This is
especially true for devices in which the internal chip is exposed. When
designing circuits, make sure that devices are protected against incident light
from external sources. This problem is not limited to optical semiconductors
and EPROMs. All types of device can be affected by light.
4.6.7 Dust and Oil
Just like corrosive gases, dust and oil can cause chemical reactions in devices,
which will adversely affect a device’s electrical characteristics. To avoid this
problem, do not use devices in dusty or oily environments. This is especially
important for optical devices because dust and oil can affect a device’s optical
characteristics as well as its physical integrity and the electrical performance
factors mentioned above.
4.6.8 Fire
Semiconductor devices are combustible; they can emit smoke and catch fire if
heated sufficiently. When this happens, some devices may generate poisonous
gases. Devices should therefore never be used in close proximity to an open
flame or a heat-generating body, or near flammable or combustible materials.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| TMP93CW41DF(JZ) | 制造商:Toshiba America Electronic Components 功能描述:MCU 16BIT TLCS-900 CISC ROMLESS 3.3V/5V 100LQFP - Bulk |
| TMP93CW41DF(Z) | 制造商:Toshiba America Electronic Components 功能描述:MCU 16BIT TLCS-900 CISC ROMLESS 3.3V/5V 100LQFP - Rail/Tube |
| TMP93CW41DFG(C,JZ) | 制造商:Toshiba America Electronic Components 功能描述: |
| TMP93CW41DFG(JOA) | 制造商:Toshiba America Electronic Components 功能描述:INTEGRATED CIRCUIT MICROCONTROLLER ROMLESS 16 BIT INTEGRATED - Bulk |
| TMP93CW41DFG(JZ) | 制造商:Toshiba America Electronic Components 功能描述:MCU 16BIT TLCS-900 CISC ROMLESS 3.3V/5V 100LQFP - Bulk |
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