參數(shù)資料
型號(hào)： STM32F102RBT6TR
廠商： STMICROELECTRONICS
元件分類(lèi)： 微控制器/微處理器
英文描述： 32-BIT, FLASH, 16 MHz, RISC MICROCONTROLLER, PQFP64
封裝： 10 X 10 MM, 0.50 MM PITCH, ROHS COMPLIANT, LQFP-64
文件頁(yè)數(shù)： 40/69頁(yè)
文件大?。?/td> 805K
代理商： STM32F102RBT6TR
STM32F102x8, STM32F102xB
Electrical characteristics
5.3.10
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (Electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the
device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
●
Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 1000-4-2 standard.
●
FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and
VSS through a 100 pF capacitor, until a functional disturbance occurs. This test is
compliant with the IEC 1000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in Table 29. They are based on the EMS levels and classes
defined in application note AN1709.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and pre
qualification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
●
Corrupted program counter
●
Unexpected reset
●
Critical Data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second. To complete these trials, ESD stress can be applied directly on the device, over the
range of specification values. When unexpected behavior is detected, the software can be
hardened to prevent unrecoverable errors occurring (see application note AN1015).
Table 29.
EMS characteristics
Symbol
Parameter
Conditions
Level/Class
VFESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
VDD = 3.3 V, TA = +25 °C,
fHCLK= 48 MHz
conforms to IEC 1000-4-2
2B
VEFTB
Fast transient voltage burst limits to be
applied through 100 pF on VDD and VSS pins
to induce a functional disturbance
VDD = 3.3 V, TA = +25 °C,
fHCLK = 48 MHz
conforms to IEC 1000-4-4
4A
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
STM32F102X4 制造商:STMICROELECTRONICS 制造商全稱(chēng):STMicroelectronics 功能描述:Low-density USB access line, ARM-based 32-bit MCU with 16/32 KB Flash, USB FS interface, 5 timers, ADC & 5 communication interfaces
STM32F102X6 制造商:STMICROELECTRONICS 制造商全稱(chēng):STMicroelectronics 功能描述:Low-density USB access line, ARM-based 32-bit MCU with 16/32 KB Flash, USB FS interface, 5 timers, ADC & 5 communication interfaces
STM32F102x8 制造商:STMICROELECTRONICS 制造商全稱(chēng):STMicroelectronics 功能描述:Medium-density USB access line,ARM-based 32b MCU with 64/128KB Flash,USB FS interface,6 timers, ADC&8 com. interfaces
STM32F102xB 制造商:STMICROELECTRONICS 制造商全稱(chēng):STMicroelectronics 功能描述:Medium-density USB access line,ARM-based 32b MCU with 64/128KB Flash,USB FS interface,6 timers, ADC&8 com. interfaces
STM32F1038 制造商:STMICROELECTRONICS 制造商全稱(chēng):STMicroelectronics 功能描述:Medium-density performance line ARM-based 32-bit MCU with 64 or 128 KB Flash, USB, CAN, 7 timers, 2 ADCs, 9 com. interfaces
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