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參數(shù)資料
| 型號： | SPT8000SIT |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | ADC |
| 英文描述： | 1-CH 14-BIT FLASH METHOD ADC, PARALLEL ACCESS, PQFP44 |
| 封裝： | PLASTIC, TQFP-44 |
| 文件頁數(shù)： | 5/11頁 |
| 文件大?。?/td> | 130K |
| 代理商： | SPT8000SIT |
3
10/12/01
SPT8000
ELECTRICAL SPECIFICATIONS
TA=25 °C, AVDD=+5.0 V, OVDD=3.3 V, S=20 MSPS, Internal References, unless otherwise specified.
TEST
SPT8000
PARAMETERS
CONDITIONS
LEVEL
MIN
TYP
MAX
UNITS
Clock Input (CLK)
Logic 1 Voltage
TBD
V
Logic 0 Voltage
TBD
V
Logic 1 Input Current
V
–10
+10
A
Logic 0 Input Current
V
–10
+10
A
Input Capacitance
V
5
pF
Digital Outputs (D0–D13, OTR, BUSY)
Logic 1 Voltage
IOH=4.5 mA, OVDD=5 V
V
90% OVDD
V
IOH=2.5 mA, OVDD=3.3 V
V
90% OVDD
V
Logic 0 Voltage
IOL=–4.5 mA, OVDD=5 V
V
10% OVDD
V
IOL=–2.5 mA, OVDD=3.3 V
V
10% OVDD
V
Voltage Reference
Output Voltage (VREF)
V
1.0
V
Reference Temperature Coefficient
V
100
ppm/°C
Top Reference Voltage (VRT)
V
3.25
V
Bottom Reference Voltage (VRC)
V
1.25
V
Common Mode Voltage (CM)
V
2.25
V
Power Supply Requirements
AVDD Supply Voltage
V
4.75
5.0
5.25
V
OVDD Supply Voltage
V
3.3
5.25
V
AVDD Supply Current
Full Scale 5 MHz Input
V
145
mA
OVDD Supply Current
Full Scale 5 MHz Input
V
0.07
mA
Power Dissipation
Full Scale 5 MHz Input
V
725
mW
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
LEVEL
TEST PROCEDURE
I
100% production tested at the specified temperature.
II
100% production tested at TA = +25 °C, and sample tested at the
specified temperatures.
III
QA sample tested only at the specified temperatures.
IV
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
V
Parameter is a typical value for information purposes only.
VI
100% production tested at TA = +25 °C. Parameter is guaranteed
over specified temperature range.
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