參數(shù)資料
型號(hào)： SN74LVTH182514DGG
廠商： Texas Instruments, Inc.
英文描述： 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
中文描述： 的3.3V ABT生根粉掃描測(cè)試設(shè)備與20位通用總線收發(fā)器
文件頁(yè)數(shù)： 10/34頁(yè)
文件大小： 548K
代理商： SN74LVTH182514DGG
SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS670C – AUGUST 1996 – REVISED MARCH 1998
10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control register
The boundary-control register (BCR) is three bits long. The BCR is used in the context of the boundary-run
(RUNT) instruction to implement additional test operations not included in the basic SCOPE instruction set.
Such operations include PRPG, PSA, and binary count up (COUNT). Table 4 shows the test operations that
are decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 010, which selects the PSA test operation. The boundary-control register order of scan
is shown in Figure 3.
Bit 0
(LSB)
TDO
TDI
Bit 1
Bit 2
(MSB)
Figure 3. Boundary-Control Register Order of Scan
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
reducing the number of bits per test pattern that must be applied to complete a test operation. During
Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in Figure 4.
Bit 0
TDO
TDI
Figure 4. Bypass Register Order of Scan
相關(guān)PDF資料
PDF描述
SN74LVTH18514DGG 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54LVTH18514HKC 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54LVTH182514HKC 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18512DGG Ceramic Chip Capacitors / MIL-PRF-55681; Capacitance [nom]: 20pF; Working Voltage (Vdc)[max]: 100V; Capacitance Tolerance: +/-1%; Dielectric: Multilayer Ceramic; Temperature Coefficient: C0G (NP0); Lead Style: Surface Mount Chip; Lead Dimensions: 1206; Termination: Sn60 Coated; Body Dimensions: 0.125" x 0.062" x 0.051"; Container: Bag; Features: MIL-PRF-55681: R Failure Rate
SN74LVTH182512DGG 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74LVTH182646APM 功能描述:特定功能邏輯 18bit ABT 3.3V RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74LVTH182652APM 功能描述:特定功能邏輯 10-Bit Bus Interface F-F W/3-State Otpt RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74LVTH18502APM 功能描述:特定功能邏輯 3.3-V ABT w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74LVTH18502APMG4 功能描述:特定功能邏輯 3.3-V ABT w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74LVTH18502APMR 功能描述:特定功能邏輯 10-Bit Bus/MOS Mem Drv RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
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