- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄365651 > SN74BCT8374ANT (Texas Instruments, Inc.) SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS PDF資料下載
參數(shù)資料
| 型號： | SN74BCT8374ANT |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
| 中文描述： | 掃描測試設(shè)備與八路D型邊沿觸發(fā)觸發(fā)器 |
| 文件頁數(shù)： | 8/26頁 |
| 文件大?。?/td> | 474K |
| 代理商： | SN74BCT8374ANT |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁當(dāng)前第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁
SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
8
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
register overview
With the exception of the bypass register, any test register may be thought of as a serial-shift register with a
shadow latch on each bit. The bypass register differs in that it contains only a shift register. During the
appropriate capture state (Capture-IR for instruction register, Capture-DR for data registers), the shift register
may be parallel loaded from a source specified by the current instruction. During the appropriate shift state
(Shift-IR or Shift-DR), the contents of the shift register are shifted out from TDO while new contents are shifted
in at TDI. During the appropriate update state (Update-IR or Update-DR), the shadow latches are updated from
the shift register.
instruction register description
The instruction register (IR) is eight bits long and tells the device what instruction is to be executed. Information
contained in the instruction includes the mode of operation (either normal mode, in which the device performs
its normal logic function, or test mode, in which the normal logic function is inhibited or altered), the test operation
to be performed, which of the three data registers is to be selected for inclusion in the scan path during
data-register scans, and the source of data to be captured into the selected data register during Capture-DR.
Table 2 lists the instructions supported by the ’BCT8374A. The even-parity feature specified for SCOPE
devices is not supported in this device. Bit 7 of the instruction opcode is a don’t-care bit. Any instructions that
are defined for SCOPE
devices but are not supported by this device default to BYPASS.
During Capture-IR, the IR captures the binary value 10000001. As an instruction is shifted in, this value is shifted
out via TDO and can be inspected as verification that the IR is in the scan path. During Update-IR, the value
that has been shifted into the IR is loaded into shadow latches. At this time, the current instruction is updated
and any specified mode change takes effect. At power up or in the Test-Logic-Reset state, the IR is reset to the
binary value 11111111, which selects the BYPASS instruction. The IR order of scan is shown in Figure 2.
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
TDO
TDI
Bit 7
(MSB)
Don’t
Care
Bit 0
(LSB)
Figure 2. Instruction Register Order of Scan
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74BCT8374ADWR | Replaced by BQ20Z80A-V110 : Impedance Track (TM) 1% accurate Gas Gauge for LiIon batteries SBS1.1 compliant 38-TSSOP -40 to 85 |
| SN74BCT8374ADWRE4 | Replaced by BQ20Z80A-V110 : Impedance Track (TM) 1% accurate Gas Gauge for LiIon batteries SBS1.1 compliant 38-TSSOP -40 to 85 |
| SN74CBT16210DGV | 20-BIT FET BUS SWITCH |
| SN74CBT16210DGG | 20-BIT FET BUS SWITCH |
| SN74CBT16232DGG | SYNCHRONOUS 16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74BCT8374ANTE4 | 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8374NT | 制造商:Texas Instruments 功能描述:Flip Flop, Octal, D Type, 24 Pin, Plastic, DIP |
| SN74BCT899DW | 制造商:Texas Instruments 功能描述: |
| SN74CB373384DBQR | 制造商:Texas Instruments 功能描述: |
| SN74CB3Q16210DGGR | 功能描述:數(shù)字總線開關(guān) IC Fixed LDO Volt Reg RoHS:否 制造商:Texas Instruments 開關(guān)數(shù)量:24 傳播延遲時間:0.25 ns 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:TSSOP-56 封裝:Reel |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。