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參數(shù)資料
| 型號(hào)： | SN74BCT8374ANT |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
| 中文描述： | 掃描測(cè)試設(shè)備與八路D型邊沿觸發(fā)觸發(fā)器 |
| 文件頁(yè)數(shù)： | 17/26頁(yè) |
| 文件大?。?/td> | 474K |
| 代理商： | SN74BCT8374ANT |
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SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
17
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54BCT8374A
MIN
TYP
SN74BCT8374A
MIN
TYP
UNIT
MAX
MAX
VIK
VCC = 4.5 V,
VCC = 4.75 V,
II = –18 mA
IOH = –3 mA
IOH = –3 mA
IOH = –12 mA
IOH = –15 mA
IOH = –1 mA
IOH = –1 mA
IOH = –3 mA
IOL = 48 mA
IOL = 64 mA
IOL = 20 mA
IOL = 24 mA
VI = 5.5 V
VI = 2.7 V
VI = 10 V
VI = 0.5 V
–1.2
–1.2
V
2.7
3.4
2.7
3.4
Any Q
2.4
3.4
2.4
3.4
VCC = 4.5 V
2
3.2
VOH
2
3.1
V
VCC = 4.75 V,
2.7
3.4
2.7
3.4
TDO
VCC= 4 5 V
VCC = 4.5 V
2.5
3.4
2.5
3.4
2.4
3.3
2.4
3.3
Any Q
VCC= 4 5 V
VCC = 4.5 V
0.38
0.55
VOL
0.42
0.55
V
TDO
VCC= 4 5 V
VCC = 4.5 V
0.3
0.5
0.35
0.5
II
IIH
IIHH
IIL
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
0.1
0.1
mA
μ
A
mA
μ
A
–1
–35
–100
–1
–35
–100
TMS
1
1
–30
–70
–200
–30
–70
–200
IOZH
Any Q
VCC= 5 5 V
VCC = 5.5 V,
VO= 2 7 V
VO = 2.7 V
50
50
μ
A
TDO
–1
–35
–100
–1
–35
–100
IOZL
Any Q
VCC= 5 5 V
VCC = 5.5 V,
VO= 0 5 V
VO = 0.5 V
–50
–50
μ
A
TDO
–30
–70
–200
±
250
±
250
±
250
–225
–30
–70
–200
±
250
±
250
±
250
–225
IOZPU
IOZPD
Ioff
IOS
VCC = 0 to 2 V,
VCC = 2 V to 0,
VCC = 0,
VCC = 5.5 V,
VO = 0.5 V or 2.7 V
VO = 0.5 V or 2.7 V
VI or VO
≤
4.5 V
VO = 0
μ
A
μ
A
μ
A
mA
–100
–100
Outputs high
3.5
7
3.5
7
ICC
VCC = 5.5 V,
Outputs open
Outputs low
35
52
35
52
mA
Outputs disabled
1.5
3.5
1.5
3.5
Ci
Co
VCC = 5 V,
VCC = 5 V,
VI = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
10
10
pF
14
14
pF
All typical values are at VCC = 5 V, TA = 25
°
C.
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second.
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