參數(shù)資料
型號(hào)： SN74BCT8374ADWRE4
廠商： Texas Instruments, Inc.
英文描述： Replaced by BQ20Z80A-V110 : Impedance Track (TM) 1% accurate Gas Gauge for LiIon batteries SBS1.1 compliant 38-TSSOP -40 to 85
中文描述： 掃描測(cè)試設(shè)備與八路D型邊沿觸發(fā)觸發(fā)器
文件頁(yè)數(shù)： 9/26頁(yè)
文件大?。?/td> 474K
代理商： SN74BCT8374ADWRE4
SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
data register description
boundary-scan register
The boundary-scan register (BSR) is 18 bits long. It contains one boundary-scan cell (BSC) for each
normal-function input pin and one BSC for each normal-function output pin. The BSR is used to 1) store test
data that is to be applied internally to the inputs of the normal on-chip logic and/or externally to the device output
terminals, and/or 2) to capture data that appears internally at the outputs of the normal on-chip logic and/or
externally at the device input terminals.
The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The
contents of the BSR may change during Run-Test/Idle as determined by the current instruction. The contents
of the BSR are not changed in Test-Logic-Reset.
The BSR order of scan is from TDI through bits 17–0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
17
CLK
15
1D
7
1Q
16
OE
14
2D
6
2Q
–
–
13
3D
5
3Q
–
–
12
4D
4
4Q
–
–
11
5D
3
5Q
–
–
10
6D
2
6Q
–
–
9
7D
1
7Q
–
–
8
8D
0
8Q
boundary-control register
The boundary-control register (BCR) is two bits long. The BCR is used in the context of the RUNT instruction
to implement additional test operations not included in the basic SCOPE
instruction set. Such operations
include PRPG and PSA. Table 3 shows the test operations that are decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 10, which selects the PSA test operation. The BCR order of scan is shown in Figure 3.
Bit 1
(MSB)
TDO
TDI
Bit 0
(LSB)
Figure 3. Boundary-Control Register Order of Scan
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74BCT8374ADWRG4 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374ANT 功能描述:觸發(fā)器 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 電路數(shù)量:2 邏輯系列:SN74 邏輯類型:D-Type Flip-Flop 極性:Inverting, Non-Inverting 輸入類型:CMOS 輸出類型: 傳播延遲時(shí)間:4.4 ns 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:X2SON-8 封裝:Reel
SN74BCT8374ANTE4 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374NT 制造商:Texas Instruments 功能描述:Flip Flop, Octal, D Type, 24 Pin, Plastic, DIP
SN74BCT899DW 制造商:Texas Instruments 功能描述:
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