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參數(shù)資料
| 型號： | SN74BCT8374ADWRE4 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Replaced by BQ20Z80A-V110 : Impedance Track (TM) 1% accurate Gas Gauge for LiIon batteries SBS1.1 compliant 38-TSSOP -40 to 85 |
| 中文描述： | 掃描測試設備與八路D型邊沿觸發(fā)觸發(fā)器 |
| 文件頁數(shù)： | 12/26頁 |
| 文件大?。?/td> | 474K |
| 代理商： | SN74BCT8374ADWRE4 |
SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
12
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control-register opcode description
The BCR opcodes are decoded from BCR bits 1–0 as shown in Table 3. The selected test operation is performed
while the RUNT instruction is executed in the Run-Test/Idle state. The following descriptions detail the operation
of each BCR instruction and illustrate the associated PSA and PRPG algorithms.
Table 3. Boundary-Control Register Opcodes
BINARY CODE
BIT 1
→
BIT 0
MSB
→
LSB
00
DESCRIPTION
Sample inputs/toggle outputs (TOPSIP)
01
Pseudo-random pattern generation/16-bit mode (PRPG)
10
Parallel-signature analysis/16-bit mode (PSA)
11
Simultaneous PSA and PRPG/8-bit mode (PSA/PRPG)
It should be noted, in general, that while the control input BSCs (bits 17–16) are not included in the sample,
toggle, PSA, or PRPG algorithms, the output-enable BSC (bit 16 of the BSR) does control the drive state (active
or high impedance) of the device output terminals.
sample inputs/toggle outputs (TOPSIP)
Data appearing at the device input terminals is captured in the shift-register elements of the input BSCs on each
rising edge of TCK. This data is then updated in the shadow latches of the input BSCs and applied to the inputs
of the normal on-chip logic. Data in the shift register elements of the output BSCs is toggled on each rising edge
of TCK, updated in the shadow latches, and applied to the device output terminals on each falling edge of TCK.
pseudo-random pattern generation (PRPG)
A pseudo-random pattern is generated in the shift-register elements of the BSCs on each rising edge of TCK
and then updated in the shadow latches and applied to the device output terminals on each falling edge of TCK.
This data also is updated in the shadow latches of the input BSCs and applied to the inputs of the normal on-chip
logic. Figure 5 shows the 16-bit linear-feedback shift-register algorithm through which the patterns are
generated. An initial seed value should be scanned into the BSR before performing this operation. A seed value
of all zeroes will not produce additional patterns.
=
1D
1Q
2D
3D
4D
5D
6D
7D
8D
2Q
3Q
4Q
5Q
6Q
7Q
8Q
Figure 5. 16-Bit PRPG Configuration
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| SN74CBT1G125DBV | SINGLE FET BUS SWITCH |
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| SN74BCT8374ADWRG4 | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8374ANT | 功能描述:觸發(fā)器 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 電路數(shù)量:2 邏輯系列:SN74 邏輯類型:D-Type Flip-Flop 極性:Inverting, Non-Inverting 輸入類型:CMOS 輸出類型: 傳播延遲時間:4.4 ns 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:X2SON-8 封裝:Reel |
| SN74BCT8374ANTE4 | 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8374NT | 制造商:Texas Instruments 功能描述:Flip Flop, Octal, D Type, 24 Pin, Plastic, DIP |
| SN74BCT899DW | 制造商:Texas Instruments 功能描述: |
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