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參數(shù)資料
| 型號： | SN74BCT8374ADWRE4 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Replaced by BQ20Z80A-V110 : Impedance Track (TM) 1% accurate Gas Gauge for LiIon batteries SBS1.1 compliant 38-TSSOP -40 to 85 |
| 中文描述： | 掃描測試設備與八路D型邊沿觸發(fā)觸發(fā)器 |
| 文件頁數(shù)： | 10/26頁 |
| 文件大?。?/td> | 474K |
| 代理商： | SN74BCT8374ADWRE4 |
SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
thereby reducing the number of bits per test pattern that must be applied to complete a test operation.
During Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in
Figure 4.
Bit 0
TDO
TDI
Figure 4. Bypass Register Order of Scan
instruction-register opcode description
The instruction-register opcodes are shown in Table 2. The following descriptions detail the operation of
each instruction.
Table 2. Instruction-Register Opcodes
BINARY CODE
BIT 7
→
BIT 0
MSB
→
LSB
X0000000
SCOPE OPCODE
DESCRIPTION
SELECTED DATA
REGISTER
MODE
EXTEST/INTEST
BYPASS
Boundary scan
Boundary scan
Test
X0000001
Bypass scan
Bypass
Normal
X0000010
SAMPLE/PRELOAD
Sample boundary
Boundary scan
Normal
X0000011
INTEST/EXTEST
BYPASS
BYPASS
Boundary scan
Boundary scan
Test
X0000100
Bypass scan
Bypass
Normal
X0000101
Bypass scan
Bypass
Normal
X0000110
HIGHZ (TRIBYP)
Control boundary to high impedance
Bypass
Modified test
X0000111
CLAMP (SETBYP)
BYPASS
Control boundary to 1/0
Bypass
Test
X0001000
Bypass scan
Bypass
Normal
X0001001
RUNT
Boundary run test
Bypass
Test
X0001010
READBN
Boundary read
Boundary scan
Normal
X0001011
READBT
Boundary read
Boundary scan
Test
X0001100
CELLTST
Boundary self test
Boundary scan
Normal
X0001101
TOPHIP
Boundary toggle outputs
Bypass
Test
X0001110
SCANCN
Boundary-control register scan
Boundary control
Normal
X0001111
SCANCT
Boundary-control register scan
Boundary control
Test
All others
BYPASS
Bypass scan
Bypass
Normal
Bit 7 is a don’t-care bit; X = don’t care.
The BYPASS instruction is executed in lieu of a SCOPE
instruction that is not supported in the ’BCT8374A.
boundary scan
This instruction conforms to the IEEE Standard 1149.1-1990 EXTEST and INTEST instructions. The BSR is
selected in the scan path. Data appearing at the device input terminals is captured in the input BSCs, while data
appearing at the outputs of the normal on-chip logic is captured in the output BSCs. Data that has been scanned
into the input BSCs is applied to the inputs of the normal on-chip logic, while data that has been scanned into
the output BSCs is applied to the device output terminals. The device operates in the test mode.
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| SN74BCT8374ADWRG4 | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8374ANT | 功能描述:觸發(fā)器 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 電路數(shù)量:2 邏輯系列:SN74 邏輯類型:D-Type Flip-Flop 極性:Inverting, Non-Inverting 輸入類型:CMOS 輸出類型: 傳播延遲時間:4.4 ns 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:X2SON-8 封裝:Reel |
| SN74BCT8374ANTE4 | 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8374NT | 制造商:Texas Instruments 功能描述:Flip Flop, Octal, D Type, 24 Pin, Plastic, DIP |
| SN74BCT899DW | 制造商:Texas Instruments 功能描述: |
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