參數(shù)資料
型號(hào)： SN74BCT8240ADWR
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
中文描述： 掃描測(cè)試設(shè)備與八進(jìn)制反向緩沖器
文件頁(yè)數(shù)： 11/26頁(yè)
文件大?。?/td> 473K
代理商： SN74BCT8240ADWR
SN54BCT8240A, SN74BCT8240A
SCAN TEST DEVICES
WITH OCTAL INVERTING BUFFERS
SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
control boundary to high impedance
This instruction conforms to the IEEE Standard 1149.1a-1993 HIGHZ instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device
operates in a modified test mode in which all device output terminals are placed in the high-impedance state,
the device input terminals remain operational, and the normal on-chip logic function is performed.
control boundary to 1/0
This instruction conforms to the IEEE Standard 1149.1a-1993 CLAMP instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. Data in the input
BSCs is applied to the inputs of the normal on-chip logic, while data in the output BSCs is applied to the device
output terminals. The device operates in the test mode.
boundary run test
The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during
Capture-DR. The device operates in the test mode. The test operation specified in the BCR is executed during
Run-Test/Idle. The four test operations decoded by the BCR are: sample inputs/toggle outputs (TOPSIP),
PRPG, PSA, and simultaneous PSA and PRPG (PSA/PRPG).
boundary read
The BSR is selected in the scan path. The value in the BSR remains unchanged during Capture-DR. This
instruction is useful for inspecting data after a PSA operation.
boundary self test
The BSR is selected in the scan path. All BSCs capture the inverse of their current values during Capture-DR.
In this way, the contents of the shadow latches may be read out to verify the integrity of both shift-register and
shadow-latch elements of the BSR. The device operates in the normal mode.
boundary toggle outputs
The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during
Capture-DR. Data in the shift-register elements of the selected output BSCs is toggled on each rising edge of
TCK in Run-Test/Idle and is then updated in the shadow latches and applied to the associated device output
terminals on each falling edge of TCK in Run-Test/Idle. Data in the selected input BSCs remains constant and
is applied to the inputs of the normal on-chip logic. Data appearing at the device input terminals is not captured
in the input BSCs. The device operates in the test mode.
boundary-control-register scan
The BCR is selected in the scan path. The value in the BCR remains unchanged during Capture-DR. This
operation must be performed before a boundary-run test operation to specify which test operation is to
be executed.
相關(guān)PDF資料
PDF描述
SN74BCT8240ADWRE4 SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
SN54BCT8240AFK SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
SN54BCT8240AJT SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
SN74BCT8240ANT SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
SN74BCT8240ANTE4 SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74BCT8240ADWRE4 功能描述:特定功能邏輯 Prog PCM w/Microphn Amps & Speaker Drvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8240ADWRG4 功能描述:特定功能邏輯 IEEE Std 1149.1 Bndry Sacn Tst Devic RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8240ANT 功能描述:緩沖器和線路驅(qū)動(dòng)器 Device w/Octal Inverting Buffers RoHS:否 制造商:Micrel 輸入線路數(shù)量:1 輸出線路數(shù)量:2 極性:Non-Inverting 電源電壓-最大:+/- 5.5 V 電源電壓-最小:+/- 2.37 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:MSOP-8 封裝:Reel
SN74BCT8240ANTE4 功能描述:特定功能邏輯 Device w/Octal Inverting Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8244ADW 功能描述:特定功能邏輯 Device w/Octal Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
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