參數(shù)資料
型號(hào)： SN74BCT8240ADWR
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
中文描述： 掃描測(cè)試設(shè)備與八進(jìn)制反向緩沖器
文件頁(yè)數(shù)： 10/26頁(yè)
文件大?。?/td> 473K
代理商： SN74BCT8240ADWR
SN54BCT8240A, SN74BCT8240A
SCAN TEST DEVICES
WITH OCTAL INVERTING BUFFERS
SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996
10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Table 2. Instruction-Register Opcodes
BINARY CODE
BIT 7
→
BIT 0
MSB
→
LSB
X0000000
SCOPE OPCODE
DESCRIPTION
SELECTED DATA
REGISTER
MODE
EXTEST/INTEST
BYPASS
Boundary scan
Boundary scan
Test
X0000001
Bypass scan
Bypass
Normal
X0000010
SAMPLE/PRELOAD
Sample boundary
Boundary scan
Normal
X0000011
INTEST/EXTEST
BYPASS
BYPASS
Boundary scan
Boundary scan
Test
X0000100
Bypass scan
Bypass
Normal
X0000101
Bypass scan
Bypass
Normal
X0000110
HIGHZ (TRIBYP)
Control boundary to high impedance
Bypass
Modified test
X0000111
CLAMP (SETBYP)
BYPASS
Control boundary to 1/0
Bypass
Test
X0001000
Bypass scan
Bypass
Normal
X0001001
RUNT
Boundary run test
Bypass
Test
X0001010
READBN
Boundary read
Boundary scan
Normal
X0001011
READBT
Boundary read
Boundary scan
Test
X0001100
CELLTST
Boundary self test
Boundary scan
Normal
X0001101
TOPHIP
Boundary toggle outputs
Bypass
Test
X0001110
SCANCN
Boundary-control register scan
Boundary control
Normal
X0001111
SCANCT
Boundary-control register scan
Boundary control
Test
All others
BYPASS
Bypass scan
Bypass
Normal
Bit 7 is a don’t-care bit; X = don’t care.
The BYPASS instruction is executed in lieu of a SCOPE
instruction that is not supported in the ’BCT8240A.
boundary scan
This instruction conforms to the IEEE Standard 1149.1-1990 EXTEST and INTEST instructions. The BSR is
selected in the scan path. Data appearing at the device input terminals is captured in the input BSCs, while data
appearing at the outputs of the normal on-chip logic is captured in the output BSCs. Data that has been scanned
into the input BSCs is applied to the inputs of the normal on-chip logic, while data that has been scanned into
the output BSCs is applied to the device output terminals. The device operates in the test mode.
bypass scan
This instruction conforms to the IEEE Standard 1149.1-1990 BYPASS instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device
operates in the normal mode.
sample boundary
This instruction conforms to the IEEE Standard 1149.1-1990 SAMPLE/PRELOAD instruction. The BSR is
selected in the scan path. Data appearing at the device input terminals is captured in the input BSCs, while data
appearing at the outputs of the normal on-chip logic is captured in the output BSCs. The device operates in the
normal mode.
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參數(shù)描述
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SN74BCT8240ADWRG4 功能描述:特定功能邏輯 IEEE Std 1149.1 Bndry Sacn Tst Devic RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8240ANT 功能描述:緩沖器和線路驅(qū)動(dòng)器 Device w/Octal Inverting Buffers RoHS:否 制造商:Micrel 輸入線路數(shù)量:1 輸出線路數(shù)量:2 極性:Non-Inverting 電源電壓-最大:+/- 5.5 V 電源電壓-最小:+/- 2.37 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:MSOP-8 封裝:Reel
SN74BCT8240ANTE4 功能描述:特定功能邏輯 Device w/Octal Inverting Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8244ADW 功能描述:特定功能邏輯 Device w/Octal Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
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