Si5338
Rev. 1.0
13
Random Jitter
(12kHz–20MHz)
RJ
Output and feedback
MultiSynth in integer or
—
0.7
1.5
ps RMS
Deterministic Jitter
DJ
Output MultiSynth
operated in fractional
—3
15
ps pk-pk
Output MultiSynth
operated in integer
—2
10
ps pk-pk
Total Jitter
(12kHz–20MHz)
TJ =DJ+14xRJ
Output MultiSynth
operated in fractional
—
13
36
ps pk-pk
Output MultiSynth
operated in integer
—
12
20
ps pk-pk
Table 12. Jitter Specifications1,2,3 (Continued)
(VDD = 1.8 V –5% to +10%, 2.5 V ±10%, or 3.3 V ±10%, TA = –40 to 85 °C)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Notes:
1. All jitter measurements apply for LVDS/HCSL/LVPECL output format with a low noise differential input clock and are
made with an Agilent 90804 oscilloscope. All RJ measurements use RJ/DJ separation.
2. For best jitter performance, keep the single ended clock input slew rates at Pins 3 and 4 more than 1.0 V/ns and the
differential clock input slew rates more than 0.3 V/ns.
3. All jitter data in this table is based upon all output formats being differential. When single-ended outputs are used, there
is the potential that the output jitter may increase due to the nature of single-ended outputs. If your configuration
implements any single-ended output and any output is required to have jitter less than 3 ps rms, contact Silicon Labs
for support to validate your configuration and ensure the best jitter performance. In many configurations, CMOS
outputs have little to no effect upon jitter.
4. DJ for PCI and GbE is < 5 ps pp
5. Output MultiSynth in Integer mode.
6. All output clocks 100 MHz HCSL format. Jitter is from the PCIE jitter filter combination that produces the highest jitter.
See AN562 for details.
7. Input frequency to the Phase Detector between 25 and 40 MHz and any output frequency > 5MHz.
8. Measured in accordance with JEDEC standard 65.
9. Rj is multiplied by 14; estimate the pp jitter from Rj over 212 rising edges.