參數(shù)資料
型號: SI5017-D-GM
廠商: Silicon Laboratories Inc
文件頁數(shù): 6/26頁
文件大小: 0K
描述: IC CLOCK/DATA RECOVERY 28MLP
標準包裝: 60
系列: DSPLL®
類型: 時鐘和數(shù)據(jù)恢復(fù)(CDR)
PLL:
主要目的: SONET/SDH,ATM 應(yīng)用
輸入: 時鐘
輸出: CML
電路數(shù): 1
比率 - 輸入:輸出: 1:2
差分 - 輸入:輸出: 是/是
頻率 - 最大: 2.7GHz
電源電壓: 3.135 V ~ 3.465 V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 28-VFQFN 裸露焊盤
供應(yīng)商設(shè)備封裝: 28-MLP-EP(5x5)
包裝: 管件
其它名稱: 336-1279
Si5017
14
Rev. 1.5
In many applications it is desirable to produce a fixed
amount of signal hysteresis for an alarm indicator such
as LOS, since a marginal data input signal could cause
intermittent toggling, leading to false alarm status.
When it is anticipated that very low-level DIN signals will
be encountered, the introduction of an adequate
amount of LOS hysteresis is recommended to minimize
any undesirable LOS signal toggling. Figure 7 illustrates
a simple circuit that may be used to set a fixed level of
LOS signal hysteresis for the Si5017 CDR. The value of
R1 may be chosen to provide a range of hysteresis from
3 to 8 dB where a nominal value of 800
adjusts the
hysteresis level to approximately 6 dB. Use a value of
500
or 1000 for R1 to provide 3 dB or 8 dB of
hysteresis, respectively.
Hysteresis is defined as the ratio of the LOS deassert
level (LOSD) and the LOS assert level (LOSA). The
hysteresis in decibels is calculated as 20log(LOSD/
LOSA).
4.8. Bit-Error-Rate (BER) Detection
The Si5017 uses a proprietary Silicon Laboratories
algorithm to generate a bit-error-rate (BER) alarm on
the BER_ALM pin if the observed BER is greater than a
user programmable threshold. Bit error detection relies
on the input data edge timing; edges occurring outside
of the expected event window are counted as bit errors.
The BER threshold is programmed by applying a
voltage to the BER_LVL pin between 500 mV and
2.25 V corresponding to a BER of approximately 10–10
and 10–6, respectively. The voltage present on
BER_LVL maps to the BER as follows: log10(BER) = (4
x BER_LVL) – 13. (BER_LVL is in volts; BER is in bits
per second.).
4.9. Data Slicing Level
The Si5017 provides the ability to externally adjust the
slicing level for applications that require bit-error-rate
(BER) optimization. Adjustments in slicing level of
±25 mV (typical, relative to the internally set input
common mode voltage) are supported. The slicing level
is set by applying a voltage between 0.75 and 2.25 V to
the SLICE_LVL input. See Figure 8 for the operation
levels of the slice circuit.
When SLICE_LVL is driven below 500 mV, the slicing
level adjustment is disabled, and the slicing level is set
to the cross-point of the differential input signal.
Note: The slice circuit is designed to only work with pseudo-
random, dc-balanced data.
Figure 8. Si5017 OC-48 Slice Specification
-40
-30
-20
-10
0
10
20
30
40
0.00
0.25
0.50
0.75
1.00
1.25
1.50
1.75
2.00
2.25
N
o
tS
pec
ified
S
lic
e
D
is
able
10 mV
Note: SLICE is a continuous curve. This chart shows
the range of results from part-to-part.
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