
General Information
Semiconductor Group
4
Table of Contents
6.8
Test Mode .................................................................................................................68
6.7
Special RTS Function ...............................................................................................68
Operational Description
.........................................................................................69
7.1
RESET...................................................................................................................... 69
7.2
Initialization ...............................................................................................................70
7.3
Operational Phase.................................................................................................... 71
7.4
Data Transmission.................................................................................................... 71
7.5
Data Reception .........................................................................................................75
8
Detailed Register Description
................................................................................ 79
8.1
Register Address Arrangement .................................................................................79
8.2
Register Definitions ...................................................................................................80
Electrical Characteristics
.....................................................................................108
10
Quartz Specifications
...........................................................................................118
11
Package Outlines
..................................................................................................125
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