
2
S29GL-N MirrorBit Flash Family
S29GL-N_00_B3  October 13, 2006
D a t a  S h e e t
General Description
The S29GL512/256/128N family of devices are 3.0V single power flash memory manufac-
tured using 110 nm
MirrorBit technology. The S29GL512N is a 512 Mbit, organized as 
33,554,432 words or 67,108,864 bytes. The S29GL256N is a 256 Mbit, organized as 
16,777,216 words or 33,554,432 bytes. The S29GL128N is a 128 Mbit, organized as 
8,388,608 words or 16,777,216 bytes. The devices have a 16-bit wide data bus that can also 
function as an 8-bit wide data bus by using the BYTE# input. The device can be programmed 
either in the host system or in standard EPROM programmers.
Access times as fast as 90 ns (S29GL128N, S29GL256N), 100 ns (S29GL512N) are available. 
Note that each access time has a specific operating voltage range (V
CC
) and an I/O voltage 
range (V
IO
), as specified in the 
 Product Selector Guide on page 6
and the 
 Ordering Infor-
mation on page 12
. The devices are offered in a 56-pin TSOP or 64-ball Fortified BGA 
package. Each device has separate chip enable (CE#), write enable (WE#) and output enable 
(OE#) controls.
Each device requires only a 
single 3.0 volt pow er supply
 for both read and write functions. 
In addition to a V
CC
 input, a high-voltage 
accelerated program (
 WP#/
ACC)
  input provides 
shorter programming times through increased current. This feature is intended to facilitate 
factory throughput during system production, but may also be used in the field if desired. 
The devices are entirely command set compatible with the 
J EDEC single-pow er-supply 
Flash standard
. Commands are written to the device using standard microprocessor write 
timing. Write cycles also internally latch addresses and data needed for the programming and 
erase operations.
The 
sector erase architecture
 allows memory sectors to be erased and reprogrammed 
without affecting the data contents of other sectors. The device is fully erased when shipped 
from the factory.
Device programming and erasure are initiated through command sequences. Once a program 
or erase operation has begun, the host system need only poll the DQ7 (Data# Polling) or DQ6 
(toggle) 
status bits 
or monitor the 
Ready/ Busy#  ( RY / BY # )
  output to determine whether 
the operation is complete. To facilitate programming, an 
Unlock Bypass
 mode reduces com-
mand sequence overhead by requiring only two write cycles to program data instead of four.
The 
Enhanced
VersatileI / O
  (V
IO
) control allows the host system to set the voltage levels 
that the device generates and tolerates on all input levels (address, chip control, and DQ input 
levels) to the same voltage level that is asserted on the V
IO
 pin. This allows the device to 
operate in a 1.8 V or 3 V system environment as required.
Hardw are data protection
 measures include a low V
CC
 detector that automatically inhibits 
write operations during power transitions. 
Persistent Sector Protection
 provides in-sys-
tem, command-enabled protection of any combination of sectors using a single power supply 
at V
CC
. 
Passw ord Sector Protection
 prevents unauthorized write and erase operations in 
any combination of sectors through a user-defined 64-bit password.
The 
Erase Suspend/ Erase Resume 
feature allows the host system to pause an erase op-
eration in a given sector to read or program any other sector and then complete the erase 
operation. The 
Program Suspend/ Program Resume
 feature enables the host system to 
pause a program operation in a given sector to read any other sector and then complete the 
program operation.
The 
hardw are RESET#  pin
 terminates any operation in progress and resets the device, 
after which it is then ready for a new operation. The RESET# pin may be tied to the system 
reset circuitry. A system reset would thus also reset the device, enabling the host system to 
read boot-up firmware from the Flash memory device.