
M16C/6S1 Group
5. Electrical Characteristics
Under development Preliminary document
Specifications in this document are tentative and subject to change.
R01DS0054EJ0050 Rev.0.50
Jun 14, 2011
5.4
Flash Memory Electrical Characteristics
Notes:
1.
Set the PM17 bit in the PM1 register to 1 (one wait).
2.
When the frequency is over this value, set the FMR17 bit in the FMR1 register to 0 (one wait) or the PM17 bit in
the PM1 register to 1 (one wait)
Notes:
1.
Definition of program and erase cycles:
The program and erase cycles refer to the number of per-block erasures. If the program and erase cycles are n
(n = 1,000), each block can be erased n times. For example, if a 64 Kbyte block is erased after writing two word
data 16,384 times, each to a different address, this counts as one program and erase cycles. Data cannot be
written to the same address more than once without erasing the block (rewrite prohibited).
2.
Cycles to guarantee all electrical characteristics after program and erase. (1 to Min. value can be guaranteed).
3.
In a system that executes multiple programming operations, the actual erasure count can be reduced by writing
to sequential addresses in turn so that as much of the block as possible is used up before performing an erase
operation. It is advisable to retain data on the erasure cycles of each block and limit the number of erase
operations to a certain number.
4.
If an error occurs during block erase, attempt to execute the clear status register command, then execute the
block erase command at least three times until the erase error does not occur.
5.
Customers desiring program/erase failure rate information should contact their Renesas Electronics support
representative.
6.
The data hold time includes time that the power supply is off or the clock is not supplied.
7.
After an erase start or erase restart, if an interval of at least 20 ms is not set before the next suspend request, the
erase sequence cannot be completed.
Table 5.8
CPU Clock When Operating Flash Memory (f(BCLK))
VCC1 = 2.7 to 3.6 V, Topr = -20 to 85°C/-40 to 85°C unless otherwise specified.
Symbol
Parameter
Conditions
Standard
Unit
Min.
Typ.
Max.
—
CPU rewrite mode
MHz
f(SLOW_R)
Slow read mode
5MHz
—
Low current consumption read mode
fC(32.768)
35
kHz
—
Data flash read
3.0 V
< V
CC1 < 3.6 V
MHz
2.7 V
≤ V
CC1 ≤ 3.0 V
MHz
Table 5.9
Flash Memory (Program ROM 1, 2) Electrical Characteristics
VCC1 = 2.7 to 3.6 V at Topr = 0 to 60°C (option: -40°C to 85°C), unless otherwise specified.
Symbol
Parameter
Conditions
Standard
Unit
Min.
Typ.
Max.
—
times
—
Two words program time
VCC1 = 3.3 V, Topr = 25°C
150
4000
s
—
Lock bit program time
VCC1 = 3.3 V, Topr = 25°C
70
3000
s
—
Block erase time
VCC1 = 3.3 V, Topr = 25°C0.2
3.0
s
td(SR-SUS) Time delay from suspend request
until suspend
5 + CPU clock
× 3 cycles
ms
—
Interval from erase start/restart
until following suspend request
0
s
—
Suspend interval necessary for
auto-erasure to complete
(7)20
ms
—
Time from suspend until erase
restart
30 + CPU clock
× 1 cycle
s
—
Program, erase voltage
2.7
3.6
V
—
Read voltage
2.7
3.6
V
—
Program, erase temperature
0
60
°C
tPS
Flash memory circuit stabilization wait time
50
s
—
Ambient temperature = 55
°C20
year