參數(shù)資料
型號(hào)： PDI1394P23EC
廠商： NXP SEMICONDUCTORS
元件分類： 微控制器/微處理器
英文描述： 2-port/1-port 400 Mbps physical layer interface
中文描述： 2 CHANNEL(S), 400M bps, SERIAL COMM CONTROLLER, PBGA64
封裝： 8 X 8 X 1.05 MM, PLASTIC, LFBGA-64
文件頁(yè)數(shù)： 18/42頁(yè)
文件大小： 233K
代理商： PDI1394P23EC
Philips Semiconductors
Preliminary data
PDI1394P23
2-port/1-port 400 Mbps physical layer interface
2001 Sep 06
18
The Vendor Identification page is used to identify the vendor/manufacturer and compliance level. The page is selected by writing 1 to the
Page_Select field in base register 7. The configuration of the Vendor Identification page is shown in Table 5, and corresponding field
descriptions are given in Table 6.
Table 5. Page 1 (Vendor ID) Register Configuration
ADDRESS
BIT POSITION
3
Compliance
Reserved
Vendor_ID[0]
Vendor_ID[1]
Vendor_ID[2]
Product_ID[0]
Product_ID[1]
Product_ID[2]
0
1
2
4
5
6
7
1000
1001
1010
1011
1100
1101
1110
1111
Table 6. Page 1 (Vendor ID) Register Field Descriptions
FIELD
SIZE
8
TYPE
Rd
DESCRIPTION
Compliance
Compliance level. For the PDI1394P23, this field is 01h, indicating compliance with the P1394a
specification.
Manufacturer’s organizationally unique identifier (OUI). For the PDI1394P23, this field is 00_60_37h
(Philips Semiconductors) (the MSB is at register address 1010b).
Product identifier. For the PDI1394P23, this field is 42_20_01 (the MSB is at register address 1101b).
Vendor_ID
24
Rd
Product_ID
24
Rd
The Vendor-Dependent page provides access to the special control features of the PDI1394P23, as well as configuration and status information
used in manufacturing test and debug. This page is selected by writing 7 to the Page Select field in base register 7. The configuration of the
Vendor-Dependent page is shown in Table 7 and corresponding field descriptions given in Table 8.
Table 7. Page 7 (Vendor-Dependent) Register Field Descriptions
ADDRESS
BIT POSITION
3
0
1
2
4
5
6
7
1000
1001
1010
1011
1100
1101
1110
1111
Reserved
Reserved for test
Link_Speed
Bridge_Aware
Reserved for test
Reserved for test
Reserved for test
Reserved for test
Reserved for test
Reserved for test
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