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參數資料
| 型號： | PA28F008SA-85 |
| 廠商： | INTEL CORP |
| 元件分類： | PROM |
| 英文描述： | 8-MBIT (1-MBIT x 8) FlashFileTM MEMORY |
| 中文描述： | 1M X 8 FLASH 12V PROM, 85 ns, PDSO44 |
| 封裝： | 0.525 X 1.110 INCH, PLASTIC, SOP-44 |
| 文件頁數： | 23/33頁 |
| 文件大?。?/td> | 466K |
| 代理商： | PA28F008SA-85 |
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28F008SA
AC INPUT/OUTPUT REFERENCE WAVEFORM
(1)
290429–11
AC test inputs are driven at V
OH
(2.4 V
TTL
) for a Logic ‘‘1’’ and V
OL
(0.45 V
TTL
) for a Logic
‘‘0’’. Input timing begins at V
IH
(2.0 V
TTL
) and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and
V
IL
. Input rise and fall times (10% to 90%)
k
10 ns.
AC TESTING LOAD CIRCUIT
(1)
C
L
e
100 pF
C
L
Includes Jig
Capacitance
R
L
e
3.3 k
X
290429–12
HIGH SPEED
AC INPUT/OUTPUT REFERENCE WAVEFORM
(2)
290429–17
AC test inputs are driven at 3.0V for a Logic ‘‘1’’ and 0.0V for a Logic ‘‘0’’. Input timing
begins, and output timing ends, at 1.5V. Input rise and fall times (10% to 90%)
k
10 ns.
HIGH SPEED
AC TESTING LOAD CIRCUIT
(2)
C
L
e
30 pF
C
L
Includes Jig
Capacitance
R
L
e
3.3 k
X
290429–18
NOTES:
1. Testing characteristics for 28F008SA-85 in Standard configuration, and 28F008SA-120.
2. Testing characteristics for 28F008SA-85 in High Speed configuration.
AC CHARACTERISTICSDRead-Only Operations
(1)
Versions
V
CC
g
5%
28F008SA-85
(4)
Unit
V
CC
g
10%
28F008SA-85
(5)
28F008SA-120
(5)
Symbol
Parameter
Notes
Min
Max
Min
Max
Min
Max
t
AVAV
t
RC
Read Cycle Time
85
90
120
ns
t
AVQV
t
ACC
Address to Output Delay
85
90
120
ns
t
ELQV
t
CE
CE
Y
to Output Delay
2
85
90
120
ns
t
PHQV
t
PWH
RP
Y
High to Output Delay
400
400
400
ns
t
GLQV
t
OE
OE
Y
to Output Delay
2
40
45
50
ns
t
ELQX
t
LZ
CE
Y
to Output Low Z
3
0
0
0
ns
t
EHQZ
t
HZ
CE
Y
High to Output High Z
3
55
55
55
ns
t
GLQX
t
OLZ
OE
Y
to Output Low Z
3
0
0
0
ns
t
GHQZ
t
DF
OE
Y
High to Output High Z
3
30
30
30
ns
t
OH
Output Hold from
Addresses, CE
Y
or OE
Y
Change, Whichever is First
3
0
0
0
ns
NOTES:
1. See AC Input/Output Reference Waveform for timing measurements.
2. OE
Y
may be delayed up to t
CE
–t
OE
after the falling edge of CE
Y
without impact on t
CE
.
3. Sampled, not 100% tested.
4. See High Speed AC Input/Output Reference Waveforms and High Speed AC Testing Load Circuits for testing characteris-
tics.
5. See AC Input/Output Reference Waveforms and AC Testing Load Circuits for testing characteristics.
23
相關PDF資料 |
PDF描述 |
|---|---|
| PA28F008SC-85 | BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F008SA-120 | 8-MBIT (1-MBIT x 8) FlashFileTM MEMORY |
| PA28F008SC-120 | BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA34 | POWER OPERATIONAL AMPLIFIERS |
| PA44 | HIGH VOLTAGE POWER OPERATIONAL AMPLIFIER |
相關代理商/技術參數 |
參數描述 |
|---|---|
| PA28F008SA-L200 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x8 Flash EEPROM |
| PA28F008SA-L250 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x8 Flash EEPROM |
| PA28F008SC-120 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SmartVoltage FlashFile⑩ MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F008SC-85 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SmartVoltage FlashFile⑩ MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F016S5-120 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
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