8
ATmega16M1/32M1/64M1 [DATASHEET]
8209E–AVR–11/2012
externally pulled low will source current if the pull-up resistors are activated. The Port E pins are tri-stated when a
reset condition becomes active, even if the clock is not running.
If the RSTDISBL Fuse is programmed, PE0 is used as an I/O pin. Note that the electrical characteristics of PE0 dif-
fer from those of the other pins of Port E.
If the RSTDISBL Fuse is unprogrammed, PE0 is used as a reset input. A low level on this pin for longer than the
minimum pulse length will generate a reset, even if the clock is not running. The minimum pulse length is given in
Depending on the clock selection fuse settings, PE1 can be used as input to the inverting Oscillator amplifier and
input to the internal clock operating circuit.
Depending on the clock selection fuse settings, PE2 can be used as output from the inverting Oscillator amplifier.
2.2.7
AV
CC
AV
CC is the supply voltage pin for the A/D Converter, D/A Converter, Current source. It should be externally con-
nected to V
CC, even if the ADC, DAC are not used. If the ADC is used, it should be connected to VCC through a low-
pass filter.
2.2.8
AREF
This is the analog reference pin for the A/D Converter.
3.
Resources
http://www.atmel.com/avr.
4.
About code examples
This documentation contains simple code examples that briefly show how to use various parts of the device. Be
aware that not all C compiler vendors include bit definitions in the header files and interrupt handling in C is com-
piler dependent. Please confirm with the C compiler documentation for more details.
These code examples assume that the part specific header file is included before compilation. For I/O registers
located in extended I/O map, "IN", "OUT", "SBIS", "SBIC", "CBI", and "SBI" instructions must be replaced with
instructions that allow access to extended I/O. Typically "LDS" and "STS" combined with "SBRS", "SBRC", "SBR",
and "CBR".
Note:
1. See for details
5.
Data retention
Reliability Qualification results show that the projected data retention failure rate is much less than 1ppm over 20
years at 85°C or 100 years at 25°C.