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參數(shù)資料
| 型號(hào)： | MIL-PRF-19500 |
| 廠商： | 意法半導(dǎo)體 |
| 英文描述： | SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW-POWER TYPES 2N2484, 2N2484UA, 2N2484UB, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC |
| 中文描述： | 半導(dǎo)體器件，晶體管，npn型，硅，低功耗類型2N2484，2N2484UA，2N2484UB 1月，JANTX，JANTXV，揚(yáng)斯，JANHC和JANKC |
| 文件頁(yè)數(shù)： | 8/19頁(yè) |
| 文件大?。?/td> | 113K |
| 代理商： | MIL-PRF-19500 |
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MIL-PRF-19500/376E
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3. REQUIREMENTS
3.1 General. The requirements for acquiring the product described herein shall consist of this document and
MIL-PRF-19500.
3.2 Qualification. Devices furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturer’s list (QML)
before contract award (see 4.2 and 6.3).
3.3 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as
specified in MIL-PRF-19500.
3.4 Interface and physical dimensions. The interface and physical dimensions shall be as specified in MIL-PRF-
19500 and figures 1, 2, 3, 4, and 5 herein.
3.4.1 Lead finish. Unless otherwise specified, lead finish shall be solderable in accordance with MIL-PRF-19500,
and herein.
3.5 Marking. Marking shall be in accordance with MIL-PRF-19500. At the option of the manufacturer, marking
may be omitted from the body, but shall be retained on the initial container.
3.6 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance
characteristics are as specified in 1.3, 1.4, and table I.
3.7 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I
herein.
3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.2.1. JANHC and JANKC Qualification. JANHC and JANKC qualification inspection shall be in accordance with
MIL-PRF-19500.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| MINISO-8 | 8-LEAD MINI SMALL OUTLINE |
| MJ2400 | Inrush Current Controllers |
| MJB32B | PNP SILICON POWER TRANSISTOR |
| MJD117 | Complementary Silicon Power Darlington Transistors(互補(bǔ)硅功率達(dá)林頓晶體管) |
| MJD117 | PNP Silicon Darlington Transistor(PNP達(dá)林頓硅晶體管) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| MIL-PRF-19500/296 | 制造商:MICROSEMI 制造商全稱:Microsemi Corporation 功能描述:P-CHANNEL J-FET |
| MIL-PRF-19500/356 | 制造商:MICROSEMI 制造商全稱:Microsemi Corporation 功能描述:5 WATT GLASS ZENER DIODES |
| MIL-PRF-19500/564 | 制造商:IRF 制造商全稱:International Rectifier 功能描述:POWER MOSFET P-CHANNEL(BVdss=-100V, Rds(on)=0.30ohm, Id=-6.5A) |
| MIL-PRF-19500/592 | 制造商:IRF 制造商全稱:International Rectifier 功能描述:POWER MOSFET SURFACE MOUNT(SMD-1) |
| MIL-PRF-19500/655 | 制造商:IRF 制造商全稱:International Rectifier 功能描述:RADIATION HARDENED POWER MOSFET SURFACE MOUNT (SMD-2) |
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