參數(shù)資料
型號(hào): MB81V4800S-60
廠商: Fujitsu Limited
英文描述: CMOS 512K×8 BIT Fast Page Mode DRAM(CMOS 512K×8位快速頁面存取模式動(dòng)態(tài)RAM)
中文描述: 的CMOS為512k × 8位快速頁面模式的DRAM(的CMOS為512k × 8位快速頁面存取模式動(dòng)態(tài)內(nèi)存)
文件頁數(shù): 21/26頁
文件大小: 328K
代理商: MB81V4800S-60
21
MB81V4800S-60/MB81V4800S-70
CAS
Fig. 16 – CAS-BEFORE-RAS REFRESH COUNTER TEST CYCLE
(At recommended operating conditions unless otherwise noted.)
Note: Assumes that CAS-before-RAS refresh counter test cycle only.
V
IH
V
IL
V
IH
V
IL
RAS
A
0
to A
9
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
OH
V
OL
V
IH
V
IL
WE
DQ
(Input)
OE
DESCRIPTION
A special timing sequence using the CAS-before-RAS refresh counter test cycle provides a convenient method to verify the
functionality of CAS-before-RAS refresh circuitry. If, after a CAS-before-RAS refresh cycle. CAS makes a transition from High to
Low while RAS is held Low, read and write operations are enabled as shown above. Row and column addresses are defined as
follows:
Row Address: Bits A
0
through A
9
are defined by the on-chip refresh counter.
Column Address: Bits A
0
through A
8
are defined by latching levels on A
0
-A
8
at the second falling edge of CAS.
The CAS-before-RAS Counter Test procedure is as follows;
1) Initialize the internal refresh address counter by using 8 RAS only refresh cycles.
2) Use the same column address throughout the test.
3) Write “0” to all 1024 row addresses at the same column address by using normal write cycles.
4) Read “0” written in procedure 3) and check; simultaneously write “1” to the same addresses by using CAS-before-RAS
refresh counter test (read-modify-write cycles). Repeat this procedure 1024 times with addresses generated by the
internal refresh address counter.
5) Read and check data written in procedure 4) by using normal read cycle for all 1024 memory locations.
6) Reverse test data and repeat procedures 3), 4), and 5).
DQ
(Output)
“H” or
Valid Data
HIGH-Z
HIGH-Z
HIGH-Z
t
DHR
VALID DATA IN
COLUMN ADDRESS
t
CSR
t
RP
t
CP
t
RCS
t
FCAH
t
ASC
t
CWL
t
CHR
t
FRSH
t
FCAS
t
RWL
t
FCWD
t
WCR
t
FCSH
t
RAL
t
DH
t
WP
t
DS
t
DZC
t
OED
t
FCAC
t
ON
t
OEA
t
DZO
t
OEZ
t
OEH
CAS to WE Delay Time
Parameter
Unit
Min.
Max.
ns
No.
Min.
Max.
90
55
55
Symbol
91
30
ns
30
Column Address Hold Time
92
CAS Pulse width
93
RAS Hold Time
80
ns
80
55
ns
55
94
55
ns
55
ns
85
85
CAS Hold Time
95
MB81V4800S-60
MB81V4800S-70
Access Time from CAS
t
FCAC
t
FCAH
t
FCWD
t
FCAS
t
FCSH
t
FRSH
t
AR
相關(guān)PDF資料
PDF描述
MB81V4800S-70 CMOS 512K×8 BIT Fast Page Mode DRAM(CMOS 512K×8位快速頁面存取模式動(dòng)態(tài)RAM)
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