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參數(shù)資料
| 型號： | M3488Q1 |
| 廠商： | 意法半導(dǎo)體 |
| 英文描述： | 256 x 256 DIGITAL SWITCHING MATRIX |
| 中文描述： | 256 × 256數(shù)字切換矩陣 |
| 文件頁數(shù)： | 1/18頁 |
| 文件大小： | 193K |
| 代理商： | M3488Q1 |
M3488
November 1994
256 x 256 DIGITAL SWITCHING MATRIX
PRELIMINARY DATA
This isadvanced informationon a new product now indevelopment or undergoing evaluation. Details are subject to changewithout notice.
.
256 INPUT AND 256 OUTPUT CHANNEL
CMOS DIGITAL SWITCHING MATRIX COM-
PATIBLE WITH M088
.
BUILDING BLOCK DESIGNED FOR LARGE
CAPACITY ELECTRONICEXCHANGES, SUB-
SYSTEMSAND PABX
.
NO EXTRA PIN NEEDED FOR NOT-BLOCK-
INGSINGLESTAGEAND HIGHER CAPACITY
SYNTHESIS BLOCKS(512 or 1024 channels)
.
EUROPEAN TELEPHONE STANDARD COM-
PATIBLE (32 serial channels perframe)
.
PCM INPUTS AND OUTPUTS MUTUALLY
COMPATIBLE
.
ACTUAL INPUT-OUTPUT CHANNEL CON-
NECTIONS STORED AND MODIFIED VIA AN
ON CHIP 8-BIT PARALLEL MICROPROCES-
SOR INTERFACE
.
TYPICAL BIT RATE : 2Mbit/s
.
TYPICAL SYNCHRONIZATION RATE : 8KHz
(time frame is 125
μ
s)
.
5V P0WER SUPPLY
.
CMOS & TTL INPUT/OUTPUT LEVELS COM-
PATIBLE
.
HIGH DENSITY ADVANCED 1.2
μ
m HCMOS3
PROCESS
.
CHANNEL CONNECTION/DISCONNECTION
.
OUTPUT CHANNEL DISCONNECTION
.
INSERTION OF A BYTE ON A PCM OUTPUT
CHANNEL/DISCONNECTION
.
TRANSFER TO THE MICROPROCESSOR OF
A SINGLEPCM OUTPUT CHANNEL SAMPLE
.
TRANSFER TO THE MICROPROCESSOR OF
A SINGLE OUTPUT CHANNEL CONTROL
WORD
.
TRANSFER TO THE MICROPROCESSOR OF
A SELECTED0 CHANNEL PCM INPUT DATA
DIP40
PQFP44
ORDERING NUMBERS:
M3488B1
M3488Q1
ABSOLUTE MAXIMUM RATINGS
Symbol
V
CC
V
I
V
O
I
O
P
tot
T
stg
T
op
Parameter
Test Conditions
-0.3 to 7
-0.3 to V
CC
+0.3
-0.3 to V
CC
+0.3
30
1.5
-65 to 150
0 to 70
Unit
V
V
V
mA
W
°
C
°
C
Supply Voltage
Input Voltage
Off State Output Voltage
Current at Digital Outputs
Total Package Power Dissipation
Storage Temperature Range
Operating Temperature Range
Stresses above those listed under ” Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
ratings only and functional operation of the device at these or any other conditions above those indicated in the operating con-
ditions of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device
reliability.
1/18
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