參數(shù)資料
型號(hào): LRS1828
英文描述: Flash ROM
中文描述: 閃存ROM
文件頁(yè)數(shù): 23/45頁(yè)
文件大?。?/td> 1382K
代理商: LRS1828
LRS1806A
21
12.3 Write Cycle (F-WE / F-CE Controlled)
(1,2)
(T
A
= -30°C to +85°C, F-V
CC
= 2.7V to 3.3V)
Notes:
1. The timing characteristics for reading the status register during block erase, full chip erase, (page buffer) program
operations are the same as during read-only operations. See the AC Characteristics for read cycle.
2. A write operation can be initiated and terminated with either F-CE or
F-WE
.
3. Sampled, not 100% tested.
4. Write pulse width (t
WP
) is defined from the falling edge of F-CE or
F-WE
(whichever goes low last) to the rising edge of
F-CE or
F-WE
(whichever goes high first). Hence, t
WP
=t
WLWH
=t
ELEH
=t
WLEH
=t
ELWH
.
5. Write pulse width high (t
WPH
) is defined from the rising edge of F-CE or
F-WE
(whichever goes high first) to the falling
edge of F-CE or
F-WE
(whichever goes low last). Hence, t
WPH
=t
WHWL
=t
EHEL
=t
WHEL
=t
EHWL
.
6. F-V
PP
should be held at F-V
PP
=V
PPH1/2
until determination of block erase, (page buffer) program success (SR.1/3/4/5=0)
and held at F-V
PP
=V
PPH1
until determination of full chip erase success (SR.1/3/5=0).
7. t
WHR0
(t
EHR0
) after the Read Query or Read Identifier Codes command=t
AVQV
+100ns.
8. See 5.1 Command Definitions for valid address and data for block erase, full chip erase, (page buffer) program or lock bit
configuration.
Symbol
t
AVAV
t
PHWL
(t
PHEL
)
t
ELWL
(t
WLEL
)
t
WLWH
(t
ELEH
)
t
DVWH
(t
DVEH
) Data Setup to
F-WE
(F-CE) Going High
t
AVWH
(t
AVEH
)
Address Setup to
F-WE
(F-CE) Going High
t
WHEH
(t
EHWH
) F-CE (
F-WE
) Hold from
F-WE
(F-CE) High
t
WHDX
(t
EHDX
) Data Hold from
F-WE
(F-CE) High
t
WHAX
(t
EHAX
) Address Hold from
F-WE
(F-CE) High
t
WHWL
(t
EHEL
)
F-WE
(F-CE) Pulse Width High
t
SHWH
(t
SHEH
)
F-WP High Setup to
F-WE
(F-CE) Going High
t
VVWH
(t
VVEH
) F-V
PP
Setup to
F-WE
(F-CE) Going High
t
WHGL
(t
EHGL
)
Write Recovery before Read
t
QVSL
F-WP High Hold from Valid SRD, F-RY/BY High-Z
t
QVVL
F-V
PP
Hold from Valid SRD, F-RY/BY High-Z
t
WHR0
(t
EHR0
)
F-WE
(F-CE) High to SR.7 Going “0”
t
WHRL
(t
EHRL
)
F-WE
(F-CE) High to F-RY/BY Going Low
Parameter
Notes
Min.
Max.
Unit
Write Cycle Time
85
ns
F-RST High Recovery to F-WE (
F-CE
) Going Low
3
150
ns
F-CE (
F-WE
) Setup to
F-WE
(F-CE) Going Low
4
0
ns
F-WE
(F-CE) Pulse Width
4
60
ns
8
40
ns
8
50
ns
0
ns
0
ns
0
ns
5
30
ns
3
0
ns
3
200
ns
30
ns
3, 6
0
ns
3, 6
0
ns
3, 7
t
AVQV
+40
ns
3
100
ns
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