參數(shù)資料
型號： LRI512-C40
廠商： 意法半導體
元件分類： DRAM
英文描述： EEPROM
中文描述： EEPROM的
文件頁數(shù)： 44/54頁
文件大?。?/td> 351K
代理商： LRI512-C40
LRI512
44/54
MAXIMUM RATING
Stressing the device above the rating listed in the
Absolute Maximum Ratings table may cause per-
manent damage to the device. These are stress
ratings only and operation of the device at these or
any other conditions above those indicated in the
Operating sections of this specification is not im-
plied. Exposure to Absolute Maximum Rating con-
ditions for extended periods may affect device
reliability. Refer also to the STMicroelectronics
SURE Program and other relevant quality docu-
ments.
Table 56. Absolute Maximum Ratings
Note: 1. IPC/JEDEC J-STD-020A
2. ESD test: ISO10373-7 specification
Symbol
Parameter
Condition
Min.
Max.
Unit
T
STG
Storage Temperature
W4
ST antistatic bag,
max 23 months
15
25
°C
SB
Mounted wafer in a wafer-
sawing box (8"),
max 25 wafers
15
25
°C
A1T/ISOR
40-60% RH, max 2 Years
15
25
°C
A1S/ISOR
Reels in shrink film and
packed in hexagonal
cardboard box
15
25
°C
A2T/ISOK
40% RH, max 1 year
15
25
°C
C40
Reels in ST cardboard box
15
25
°C
V
MAX
Maximum Input Voltage on AC0 / AC1
–7
7
V
V
ESD
Electrostatic Discharge
Voltage
2
A1T/ISOR
ISO 10373-7
–7000
7000
V
A1S/ISOR
ISO 10373-7
–7000
7000
V
A2T/ISOK
ISO 10373-7
–7000
7000
V
C40
ISO 10373-7
–7000
7000
V
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